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Ultra-short pulse time waveform and chirp rate measuring device and method

A technology of ultra-short pulse and measuring device, which is applied in the direction of instruments, etc., can solve the problems of increasing the complexity of ultra-short pulse measurement work, complex optical path structure, etc., to achieve rapid analysis and judgment, and meet the effect of measurement requirements

Active Publication Date: 2015-06-10
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

This will complicate the overall optical path structure and increase the complexity of ultrashort pulse measurement work

Method used

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  • Ultra-short pulse time waveform and chirp rate measuring device and method
  • Ultra-short pulse time waveform and chirp rate measuring device and method

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Embodiment Construction

[0027] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0028] After the pulse to be measured passes through the first coupling mirror 1 and the second coupling mirror 2, it is divided into two on the beam splitter 3 to generate a reflected pulse and a transmitted pulse. The reflected pulse passes through the first reflector 4 , the second reflector 5 and the third reflector 6 and reaches the cross-correlation crystal 7 . The transmitted pulse passes through the frequency doubling crystal 8 and the fourth mirror 9 , and also reaches the cross-correlation crystal 7 . The reflected and transmitted pulses interact on the cross-correlation crystal 7 to produce a cross-correlation signal 10 . After the cross-correlation signal 10 passes through the fifth mirror 11 and a diffractive element 12, a dispersed cross-correlation signal 13...

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Abstract

An ultra-short pulse time waveform and chirp rate measuring device comprises a first coupling mirror, a second coupling mirror, a spectroscope, a first reflecting mirror, a second reflecting mirror, a third reflecting mirror, a cross-correlation crystal, a frequency doubling crystal, a fourth reflecting mirror, a fifth reflecting mirror, a diffraction element, a photoelectric detector and a computer. Front-edge and rear-edge high-resolution ratio measuring of ultra-short pulses is achieved through a cross-correlation method to obtain time waveforms and pulse widths. Ultra-short pulse spectrum measuring is achieved through diffraction elements orthogonal to the time axis to obtain the spectrum width, and accordingly, the chirp rate of measured pulses can be obtained based on the pulse width and the spectrum width, the requirement of physical experiments for the time waveform measuring and the requirement of an Ultra-short pulse laser system for measuring of the chirp rate are met conveniently.

Description

technical field [0001] The invention relates to a time waveform and chirp rate measuring device and method for ultrashort pulses, including single ultrashort pulses of picosecond and femtosecond levels. Background technique [0002] The time waveform of the ultrashort pulse is an important technical parameter in physical experiments, which determines the real-time power of the ultrashort pulse when it interacts with matter. Chirp rate is an important technical parameter in the development and debugging of ultrashort pulse laser system, which determines the feasibility of pulse width expansion and compression. [0003] There are two traditional methods for measuring the time waveform of laser pulses: an oscilloscope and a streak camera. When using a 16GHz high-speed oscilloscope for pulse width measurement, considering the bandwidth of the fast-response photocell, shielded cable, and corresponding interface circuit components, the rising edge response is 71.5ps, that is, the...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 欧阳小平朱宝强朱健强
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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