A semiconductor circuit-based anti-single event effect verification method and system

Abstract

The invention is applicable to the field of semiconductors, and provides a method and system for verifying anti-single event effect based on semiconductor circuits, including: establishing a three-dimensional device model according to process conditions; constructing a cascade circuit according to the three-dimensional model of the device; loading heavy particles on the cascade circuit Model, generate simulation data; determine the sensitive nodes in the circuit according to the simulation data; conduct single-event transient analysis on the cascaded circuit, generate the corresponding relationship between the incident energy of heavy particles and the transient current; construct the segmented current according to the sensitive nodes and the corresponding relationship model; collect key nodes in the segmented current model, and generate a model data comparison table; call the model data comparison table to build a segmented linear current source model. The invention simulates the cascaded circuit after loading the heavy particle model, accurately locates the sensitive nodes in the circuit, and realizes the rapid evaluation of the anti-single event effect ability of the circuit through single-particle transient analysis, ensuring the anti-radiation performance of the product While reasonably controlling the chip area.

Description

technical field [0001] The invention belongs to the field of semiconductors, in particular to a semiconductor circuit-based anti-single event effect verification method and system. Background technique [0002] At present, the rapid development of the aerospace industry urgently needs high-performance radiation-resistant core electronic components, but for a long time, space radiation has caused obvious degradation and failure of the performance of devices and circuits, which seriously restricts the reliability and life of electronic products. It is one of the main radiation effects faced by aerospace applications. [0003] In a radiation environment, when high-energy particles enter the device, a large number of electron-hole pairs are generated along the particle track, and cause the electric field separation in the depletion region to generate charges, which will diffuse to the depletion region and be effectively collected, thus forming transient current. At the same ti...

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Problems solved by technology

[0006] The purpose of the embodiments of the present invention is to provide a semiconductor circuit-based anti-single event effect verification method, which aims to solve the current problem of high cost and long cycle for verification of radiation-resistant devices

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