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A replaceable double coil probe and its measurement method

A technology of coil and probe base, which is applied in the field of double coil probes to achieve the effect of precise controllable distance and avoiding damage

Active Publication Date: 2018-03-06
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Since traditional magnetic susceptibility measurement equipment does not require an ultra-high vacuum environment, and for samples that are susceptible to atmospheric contamination, the magnetic susceptibility measurement must be performed in situ

Method used

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  • A replaceable double coil probe and its measurement method

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Effect test

Embodiment Construction

[0034] A replaceable double coil probe of a preferred embodiment of the present invention is as figure 1 As shown, it includes: a dual-coil probe base 1; a driving base 14 matched with the dual-coil probe base 1.

[0035]The double-coil probe base 1 includes a coil bobbin 2, a double-coil, a first threaded platform 5, a first electrode group and a first wire group. Above, and fixedly connected with the first screw platform 5 , the double group of coils includes a first coil 3 and a second coil 4 wound sequentially from inside to outside along the radial direction of the bobbin 2 . Both the first coil 3 and the second coil 4 are formed by coiling enamelled copper wires with a diameter of 0.05 mm to 0.1 mm. The bottom of the first threaded table 5 has a screw 21 , and the external thread 22 of the screw 21 matches the internal thread 51 of the driving base 14 , so that the double coil probe base 1 can be screwed in or out from the driving base 14 . In addition, the internal th...

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Abstract

The invention discloses a replaceable double-group coil probe, which comprises a double-group coil probe seat and a driving base matched with the double-group coil probe seat. Wherein, the dual-group coil probe base includes a double-group coil, a first electrode group and a first wire group, and the driving base includes a stepping motor, a scanning tube connected to the stepping motor, a second electrode group and a second wire group, and the second The electrode group is set on the inner wall of the scanning tube, the double set of coils is connected to the first electrode group through the first wire group, the first electrode group is connected to the second electrode group, and the second electrode group is connected to the phase-locking device through the second wire group. amplifier. The replaceable dual-coil probe of the present invention can integrate scanning tunneling microscope and AC magnetic susceptibility measurement, so that microscopic magnetism and macroscopic magnetism can be measured in situ in ultra-high vacuum.

Description

technical field [0001] The invention relates to a coil probe, in particular to a replaceable dual-group coil probe for magnetic measurement in an ultra-high vacuum environment. Background technique [0002] Scanning tunneling microscope is an important tool for studying the atomic structure and distribution of electronic states on the surface of materials. The function of its tunnel differential conductance spectrum can reflect the local electronic density of states on the surface of the sample. Specifically, for example, for superconducting samples, scanning tunneling spectroscopy directly measures the change of the superconducting energy gap of superconducting samples with temperature or magnetic field, and then reflects the zero resistance and diamagnetism of superconducting materials; in addition, using scanning tunneling microscopy can also It can measure the microscopic magnetic structure and hysteresis characteristics of magnetic samples. Scanning tunneling microscop...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/16G01Q60/10
Inventor 刘灿华葛剑锋贾金锋刘荧
Owner SHANGHAI JIAO TONG UNIV