Soft measurement method of mechanical parameters of the micro-motion stage of the mask stage of the lithography machine based on the compact particle swarm optimization algorithm
A technology of mechanical parameters and mask table, which is applied in the field of mechanical parameter measurement and semiconductor manufacturing equipment, can solve the problems of poor precision, achieve the effect of reducing storage space, reducing storage space requirements, and being easy to implement
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[0030] combine figure 1 and figure 2 Describe this embodiment, the mechanical parameter soft measurement method of the lithography machine mask table micro-motion table based on the Compact Particle SwarmOptimization algorithm described in this embodiment, the method includes the following steps:
[0031] Step 1: According to the mechanical mechanism and theoretical design of the micro-motion stage of the mask stage, establish the ideal kinematics model of the micro-motion stage, determine the mechanical parameters to be tested, and establish the clearance model of the micro-motion stage of the mask stage;
[0032] In the first step, the established mask stage micro-movement stage inclusion model is:
[0033]
[0034] f x It is the resultant force in the X direction of the micro-movement stage of the mask stage;
[0035] f y Y-direction resultant force of the micro-movement stage of the mask stage;
[0036] f z It is the resultant force in the Z direction of the micr...
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