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Second harmonic balance detection-based time jitter delay measurement system and method

A second harmonic and time jitter technology, applied in the field of optoelectronic communication, can solve the problems of insufficient high-resolution delay measurement level and achieve high-resolution effects

Inactive Publication Date: 2015-11-11
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a time jitter delay measurement system and method based on second harmonic balance detection to solve the high-precision time synchronization field. Insufficient level of resolution delay measurement

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  • Second harmonic balance detection-based time jitter delay measurement system and method
  • Second harmonic balance detection-based time jitter delay measurement system and method

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Embodiment Construction

[0038] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0039] The invention discloses a time jitter delay measurement device based on second harmonic balance detection, which comprises a second mirror 1, a time delay line 2, a third half mirror 3, a first mirror 4, a second mirror Half mirror 5, first focusing mirror 6, second harmonic generation medium 7, second focusing mirror 8, second half mirror 9, third mirror 10, first photoelectric probe 11, first Two photoelectric probes 1 and a differential circuit 13, as well as a first pulse input interface A1 to be tested, a secon...

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Abstract

The invention discloses a second harmonic balance detection-based time jitter delay measurement device, which comprises a first half transparent and half reflecting mirror, a second harmonic generation medium, a second half transparent and half reflecting mirror, a time delay line, a first photoelectric detector, a second photoelectric detector, a differential circuit, a third half transparent and half reflecting mirror, a first reflector, a second reflector, a first focusing mirror, a second focusing mirror, a third reflector, a first to-be-measured pulse input interface, a second to-be-measured pulse input interface and a differential signal output interface. According to the technical scheme of the invention, a second harmonic balance detection mechanism is used, according to the characteristic that output of an electric signal is 0 in the case of no delay, time jitter delay is measured, a requirement that time jitter delay has a high measurement resolution is achieved, and applications to a high-precision time synchronization system are facilitated.

Description

technical field [0001] The invention relates to the field of photoelectric communication, in particular to a time jitter delay measurement method and system based on second harmonic balance detection. Background technique [0002] With the rapid advancement of networking and informationization and the rapid development of sophisticated weapons and equipment, precise navigation and guidance, distributed radar systems, space detection, laser fusion technology, phased array antenna technology, high-performance atomic clock time comparison, free The advanced information technology fields and cutting-edge scientific fields represented by electronic lasers have continuously improved the evaluation and calibration requirements for high-precision time synchronization and its performance, from the original millisecond, microsecond, and sub-microsecond levels to the current nanosecond, sub-microsecond levels. Nanoseconds or even sub-picoseconds, which brings new difficulties and chall...

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Application Information

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IPC IPC(8): G01J11/00
Inventor 石凡张升康尚怀赢王宏博葛军冯克明
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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