Noise Suppression Method of Wavelet Transform Profiling

A technology of wavelet transform and wavelet transform coefficient, applied in the field of structured light projection three-dimensional surface shape measurement, can solve the problems of limiting the improvement of noise suppression ability, slow speed, three-dimensional surface shape error, etc., to achieve strong noise suppression ability and time-consuming Fewer, faster results

Active Publication Date: 2018-01-12
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

Both prior art 1 and prior art 2 use the method of finding the modulus maximum value of wavelet transform coefficients to obtain wavelet ridges. In the case of strong noise pollution in the optical fringe image, there are large errors, which will directly lead to the restoration of the three-dimensional surface. There is a large error in the shape
Although prior technology 3 introduces a path-related evaluation function to guide the extraction of wavelet ridges, which has strong noise suppression ability and improves the noise suppression ability of wavelet transform profilometry to a certain extent, the evaluation function only considers The scale factor and the translation factor limit the improvement of the noise suppression ability, and its implementation method requires multiple rounds of search, and the speed is slow

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  • Noise Suppression Method of Wavelet Transform Profiling
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[0034] In order to make the content, implementation process and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0035] see first figure 1 , figure 1 It is a schematic diagram of the optical image acquisition system used in the present invention. The system includes: a projection system 1 , a CCD camera 2 , a computer 3 , and an object to be measured 4 . The object 4 to be measured is within the projection range of the projection system 1 , the object 4 to be measured is within the field of view of the CCD camera 2 , and the input end of the computer 3 is connected to the output end of the CCD camera 2 .

[0036] Utilize the present invention to carry out the optical fringe image ridge extraction method flow process as follows figure 2 shown, including the following step...

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Abstract

A method for suppressing noise in wavelet transform profilometry, the method includes three steps: optical fringe image acquisition, two-dimensional continuous wavelet transform, and wavelet ridge extraction. The present invention has stronger noise suppression capability and faster speed. With the present invention, when the optical fringe image collected by the CCD camera contains strong noise, the wavelet transform profilometry can still achieve high-precision three-dimensional surface measurement.

Description

technical field [0001] The invention relates to a structured light projection three-dimensional surface shape measurement technology, in particular to a noise suppression method for wavelet transform profilometry. Background technique [0002] Wavelet transform profilometry is a kind of structured light projection three-dimensional surface shape measurement technology, which has the characteristics of fast speed, high precision and strong noise suppression ability, and is suitable for real-time or dynamic process of three-dimensional surface shape measurement. Wavelet ridge extraction is a key step in wavelet transform profilometry. The noise suppression ability and precision of wavelet ridge extraction method directly affect the three-dimensional surface shape measurement accuracy and noise suppression ability of wavelet transform profilometry. Existing wavelet ridge extraction methods include modulus maximum method (prior technology 1: Li Sikun, Su Xianyu, Chen Wenjing. A...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 徐东瀛李思坤王向朝
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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