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Measuring system for secondary current of induced voltage adder, marking device and method thereof

A technology of induced voltage and secondary current, applied in the direction of measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve the problems of large differences in B-dot sensitivity and difficulty in ensuring the consistency of B-dot magnetic induction coils, etc., to achieve Facilitate mass production, remove common mode interference, and improve the effect of output signal signal-to-noise ratio

Active Publication Date: 2016-02-17
NORTHWEST INST OF NUCLEAR TECH
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AI Technical Summary

Problems solved by technology

However, the magnetic induction coil of the current B-dot probe is usually wound into a small ring with enameled wire or steel core cable, and the consistency of multiple B-dot magnetic induction coils is difficult to guarantee, resulting in a large difference in B-dot sensitivity

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  • Measuring system for secondary current of induced voltage adder, marking device and method thereof
  • Measuring system for secondary current of induced voltage adder, marking device and method thereof
  • Measuring system for secondary current of induced voltage adder, marking device and method thereof

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Embodiment Construction

[0044]The present invention proposes a secondary current measurement system of an induced voltage superimposed device and its calibration device and method. The core idea is that six B- dot array to measure the angular distribution of the secondary current (magnetic insulation cathode current and anode current) at the outlet of each induction cavity of the IVA secondary. The magnetic induction coil of the B-dot probe is made of a printed circuit board, which improves the consistency of the probe response and facilitates mass production.

[0045] Due to the special electrical structure of the induction chamber, the pulse current fed into the induction chamber usually presents an angular non-uniform distribution at the outlet of the induction chamber. In the B-dot probe array calibration, a coaxial calibration outer cylinder is added to replace the induction cavity at the position of the original sensing cavity, so that the angular direction of the current flowing through the B-...

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Abstract

The invention provides a measuring system for a secondary current of an induced voltage adder, a marking device and a method thereof. The measuring system is characterized in that a plurality of B-dot arrays are uniformly distributed along an angular direction on inner and outer cylinders of a transition section between IVA secondary inducing chambers, so that the angular directional distribution of the secondary current at an outlet of each level of IVA secondary inducing chambers can be measured. Due to the special electric structures of the inducing chambers, the inducing chambers are replaced by coaxial marking external cylinders added on the positions of the original inducing chambers in the marking for B-dot probe arrays, so that the current passing by the B-dot probe arrays is uniform along the angular direction. A current closed loop is formed by the marking external cylinders and the transition connecting sections. At the secondary tail end, coaxial fast pulse current sources are adopted for providing uniform injection current, a current measuring coil sleeved on a grounding end is utilized to monitor the current parameters of the pulse sources and the B-dot probe arrays of the inner and outer cylinders of the secondary are marked.

Description

technical field [0001] The invention proposes a B-dot array and a calibration method for measuring the angular distribution of the secondary current of an induced voltage superimposed device, and has important applications in pulsed power devices such as induced voltage superimposed devices and vacuum magnetically insulated transmission lines. Background technique [0002] Magnetically induced voltage adders (MIVA) is a high-current pulse power accelerator topology, which can generate high-power electric pulses with a voltage of several MV to tens of MV and a current of tens of kA to hundreds of kA. Effect simulation, material dynamics experiment, high power microwave and other fields have important applications. MIVA is composed of multi-level megavolt induction cavities in series, and each induction cavity can be regarded as a pulse transformer with a transformation ratio of 1:1. Based on the principle of electromagnetic induction, the pulse voltages fed into the inductio...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00G01R35/00
Inventor 魏浩孙凤举姜晓峰梁天学丛培天邱爱慈
Owner NORTHWEST INST OF NUCLEAR TECH