Measuring system for secondary current of induced voltage adder, marking device and method thereof
A technology of induced voltage and secondary current, applied in the direction of measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve the problems of large differences in B-dot sensitivity and difficulty in ensuring the consistency of B-dot magnetic induction coils, etc., to achieve Facilitate mass production, remove common mode interference, and improve the effect of output signal signal-to-noise ratio
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[0044]The present invention proposes a secondary current measurement system of an induced voltage superimposed device and its calibration device and method. The core idea is that six B- dot array to measure the angular distribution of the secondary current (magnetic insulation cathode current and anode current) at the outlet of each induction cavity of the IVA secondary. The magnetic induction coil of the B-dot probe is made of a printed circuit board, which improves the consistency of the probe response and facilitates mass production.
[0045] Due to the special electrical structure of the induction chamber, the pulse current fed into the induction chamber usually presents an angular non-uniform distribution at the outlet of the induction chamber. In the B-dot probe array calibration, a coaxial calibration outer cylinder is added to replace the induction cavity at the position of the original sensing cavity, so that the angular direction of the current flowing through the B-...
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