Induced voltage superimposed secondary current measurement system and its calibration device and method
A technology of induced voltage and secondary current, applied in the direction of measurement device, measurement of electrical variables, measurement of current/voltage, etc., can solve the problems of large difference in B-dot sensitivity and difficulty in ensuring the consistency of B-dot magnetic induction coils. Facilitate mass production, remove common mode interference, and improve the effect of output signal signal-to-noise ratio
Active Publication Date: 2018-01-19
NORTHWEST INST OF NUCLEAR TECH
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However, the magnetic induction coil of the current B-dot probe is usually wound into a small ring with enameled wire or steel core cable, and the consistency of multiple B-dot magnetic induction coils is difficult to guarantee, resulting in a large difference in B-dot sensitivity
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[0044]The present invention proposes a secondary current measurement system of an induced voltage superimposed device and its calibration device and method. The core idea is that six B- dot array to measure the angular distribution of the secondary current (magnetic insulation cathode current and anode current) at the outlet of each induction cavity of the IVA secondary. The magnetic induction coil of the B-dot probe is made of a printed circuit board, which improves the consistency of the probe response and facilitates mass production.
[0045] Due to the special electrical structure of the induction chamber, the pulse current fed into the induction chamber usually presents an angular non-uniform distribution at the outlet of the induction chamber. In the B-dot probe array calibration, a coaxial calibration outer cylinder is added to replace the induction cavity at the position of the original sensing cavity, so that the angular direction of the current flowing through the B-...
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The invention provides a secondary current measurement system of an induced voltage superimposed device and its calibration device and method, wherein the current measurement system is angularly evenly distributed on the inner and outer cylinders of the transition section between the IVA secondary induction cavities. B‑dot array to measure the secondary current angular distribution at the outlet of each induction chamber of the IVA secondary. Due to the special electrical structure of the sensing cavity; in the B-dot probe array calibration, a coaxial calibration outer cylinder is added to replace the sensing cavity at the position of the original sensing cavity, so that the angular direction of the current flowing through the B-dot array is uniform, and the calibration The outer cylinder and the transition connecting section together form a current closed circuit. At the secondary end, a coaxial fast pulse current source is used to provide a uniform injection current, and the current measurement coil set on the ground terminal is used to monitor the current parameters of the pulse source, and to calibrate the secondary inner and outer cylinder B-dot arrays.
Description
technical field [0001] The invention proposes a B-dot array and a calibration method for measuring the angular distribution of the secondary current of an induced voltage superimposed device, and has important applications in pulsed power devices such as induced voltage superimposed devices and vacuum magnetically insulated transmission lines. Background technique [0002] Magnetically induced voltage adders (MIVA) is a high-current pulse power accelerator topology, which can generate high-power electric pulses with a voltage of several MV to tens of MV and a current of tens of kA to hundreds of kA. It has important applications in γ-ray radiation effect simulation, material dynamics experiment, high-power microwave and other fields. MIVA is composed of multi-level megavolt induction cavities in series, and each induction cavity can be regarded as a pulse transformer with a transformation ratio of 1:1. Based on the principle of electromagnetic induction, the pulse voltages ...
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IPC IPC(8): G01R19/00G01R35/00
Inventor 魏浩孙凤举姜晓峰梁天学丛培天邱爱慈
Owner NORTHWEST INST OF NUCLEAR TECH