Warp knitting fabric defect detection method based on wavelet contourlet transformation and visual saliency
A technology of wavelet contour and warp-knitted fabrics, which is applied in the field of image processing and can solve the problem of less detection of fabric defects
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[0048] The present invention will be further described below in conjunction with specific drawings.
[0049] The warp knitted fabric defect detection method based on wavelet contourlet transform and visual saliency described in the present invention, such as figure 1 shown, including the following steps:
[0050] Step 1. Select the fundamental wave and construct the wavelet transform filter;
[0051] The two-dimensional discrete wavelet transform is an extension of the one-dimensional discrete wavelet transform, and it can complete its transformation process through two one-dimensional wavelet transforms. In its implementation, a two-dimensional discrete wavelet transform requires a two-dimensional scaling function and three two-dimensional wavelet functions ψ H (x, y), ψ V (x, y) and ψ D (x, y). These functions are also generalized applications of one-dimensional functions, and can be expressed as the product of two one-dimensional functions in principle. Its expression...
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