Programmable high-integration multichannel pressure test device

Abstract

The invention discloses a programmable high-integration multichannel pressure test device, which comprises perforated panel pressure adapters, a panel, differential pressure sensors, a sensor PCB, thread adapters, an air collecting chamber, an FPGA analog-to-digital conversion PCBs, a special cable, a sensor signal conditioning PCB, connection struts, reference end pressure adapters, reference end thread joints, an Ethernet network connection joint and a DC24V connection joint. The device has the advantages of integrating programming, multiple channels, pressure field acquisition, processing and analysis, and can be used in a multichannel pressure field test in fields such as aerospace, petrochemical industry, thermoelectric production, energy development and wind tunnel test.

Description

technical field [0001] The invention relates to a pressure testing device, in particular to a programmable highly integrated multi-channel pressure testing device. Background technique [0002] In the known public documents and patents, no test device integrating programmable, multi-channel, pressure field acquisition, processing and analysis has been found. In domestic industrial sites, the traditional method of multi-channel pressure field testing is to select multiple independent pressure transmitters, output as analog signals such as current type, voltage type, or output as digital signals such as 485, can bus, through long-distance cables Transmission, connect independent data acquisition system to realize signal acquisition and processing. The data acquisition system then communicates with the computer to realize functions such as display and storage of the host computer. [0003] There are following three shortcoming in prior art: [0004] First, the industrial sit...

AI Technical Summary

Problems solved by technology

[0004] First, the industrial site environment is complex, especially the laying of a large number of cables and long-distance transmission, which is easily affected by electromagnetic interference such as space radiation and conduction, resulting in a decrease in test accuracy;

[0005] Second, the system integration level is not high, and on-site installation, debugging, and maintenance are difficult, especially in the event of a fault, troubleshooting is time-consuming and laborious;

[0006] The third is that the system construction cost is high and the development is difficult. The economic costs of sensors, cables, data acquisition systems, and power supply will increase exponentially. In addition, professional testers are required for software development.

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