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Light-splitting color photometer

A technology of spectrophotometer and colorimeter, which is applied in the field of spectrophotometer, can solve the problems of unevenness, small dynamic range, poor repeatability, etc., and achieve the effect of improving accuracy

Active Publication Date: 2016-04-20
HANGZHOU EVERFINE PHOTO E INFO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But the technical scheme of US005859709A ( figure 2 The light utilization rate of the second light source in ) is low, the illumination on the sample surface is insufficient and there is secondary diffuse reflection on the inner wall of the integrating sphere, and the repeatability is poor
JP4400538B2( image 3 ) has improved the second illumination system, but the second illumination light source illuminates the sample surface through a diffuser and a focusing device. Although this structure improves the light source utilization rate and signal-to-noise ratio, it has several significant disadvantages: first It is to directly image the light source at the sampling window at one time, but because the light shape of the light source is usually uneven, the light shape of the light source projected on the sample to be tested is also uneven, which will directly affect the SCE measurement results Although the size of the spot can be adjusted with an aperture, the defects caused by the unevenness of the light source will be more prominent when the spot is small; secondly, since there is only one aperture for adjusting the size of the spot in this structure, it is impossible to realize the adjustment of the spot The adjustment of the strength leads to obvious differences in the strength of the signal received by the detector when measuring samples with a large difference in reflectivity, the dynamic range is small, and the test accuracy is not high

Method used

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Examples

Experimental program
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Effect test

Embodiment 1

[0038] Such as Figure 4 As shown, this embodiment discloses a spectrophotometer, which is composed of an integrating sphere 1 , an optical receiving device 3 , a first lighting system 4 and a second lighting system 5 . Integrating sphere 1 bottom has sampling window 13, and integrating sphere 1 inwall is provided with extinction part 7 near sampling window 13 edges, and extinction part 7 here is the black coating (as Figure 8 As shown), the rest of the inner wall of the integrating sphere 1 is coated with a white coating with high reflectivity. A light source entrance 11 is opened on the integrating sphere 1 deviated from the central normal of the sampling window 13 at -8°, and the light emitted by the second lighting system 5 illuminates the sampling window 13 through the light entrance 11; There is a measurement window 12 at the integrating sphere 1 with a linear deviation of 8°, the optical axis of the optical receiving device 3 passes through the center of the sampling ...

Embodiment 2

[0042] Such as Figure 5 As shown, different from Embodiment 1, the first illumination system 4 in this embodiment is placed in the integrating sphere, and there is no need to open corresponding incident slits on the side wall of the integrating sphere 1 at this time. The light emitted by the first illumination system 4 is directly reflected by the integrating sphere 1 multiple times, and irradiates the surface of the tested sample in the form of diffuse incidence. Compared with the solution of placing the first lighting system 4 outside the integrating sphere in Embodiment 1, this embodiment is suitable for a small volume of the first lighting system 4, and more importantly, the number of openings is less than that of Embodiment 1, which can Achieve better light mixing effect.

Embodiment 3

[0044] Such as Image 6 As shown, different from Embodiments 1 and 2, this embodiment also includes a reflector device, which is located outside the light entrance 11 of the integrating sphere 1 and arranged along the optical path behind the second illumination system 5 . The light emitted by the condenser lens 53 of the second illumination system 5 is first reflected by the reflection device and then projected to the first reflection area 6 of the inner wall of the integrating sphere 1 through the light entrance 11. The optical axis of the light reflected by the first reflection area 6 is in line with the optical The optical axis of the receiving device 3 is mirror-symmetrical along the central normal of the sampling window 13 . The light reflected by the first reflection area 6 is projected onto the surface of the tested sample 2 and received by the optical receiving device 3 after being acted upon.

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Abstract

The invention discloses a light-splitting color photometer. Test conditions compatible for SCI and SCE are achieved by combination of a dual-light-source system consisting of a first illuminating system and a second illuminating system. The second illuminating system in the dual-light-source system comprises a second illuminating light source, a front lens, a light collecting lens and two adjustable light diaphragms; light emitted by the second illuminating light source is imaged near the light collecting lens by the front lens; the light collecting lens is used for imaging the front lens near a target area; the light emitted by the second illuminating light source is imaged, then the light shape of the light source is more uniform, namely the light source irradiated on a tested sample is more uniform; test data obtained on the basis of the light source is more accurate; the measurement reproducibility is better; the size and the intensity of light spots projected to the tested area can also be adjusted by adjusting the two light diaphragms; the colors of various objects are effectively and accurately measured; in addition, a light eliminating part is also arranged at the periphery of a tested sample taking area; the level of stray light is further reduced; the test accuracy is improved.

Description

【Technical field】 [0001] The invention relates to the technical field of color measurement, in particular to a spectrophotometer. 【Background technique】 [0002] The d / 8 measurement geometry recommended by CIE includes two structures: SCI (including the specular reflection light on the surface of the tested sample) and SCE (elimination of the specular reflection light on the surface of the tested sample). SCI measurement results have nothing to do with the surface gloss of materials, and the data are generally used for color matching; SCE excludes specular reflection light, which is closer to the results of eye observation colors, and is generally used for color acceptance and quality control. In the existing d8 spectrophotometer, the light emitted by the light source is mixed in the integrating sphere to diffusely illuminate the sample, and a receiving device is set at a position 8° away from the normal of the sample, and is connected to the wall of the integrating sphere. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/46
CPCG01J3/46
Inventor 潘建根黄艳黄英
Owner HANGZHOU EVERFINE PHOTO E INFO
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