Built-in self-test circuit suitable for 1553 bus protocol

Abstract

The invention relates to a built-in self-test (BIST) circuit suitable for a 1553 bus protocol, comprising a self-test register, a BIST logic member, a read only memory for storing test vectors, and a BIST state register. The circuit is provided with a BIST function; partial reserved bits in the start/reset register of an original protocol processor are used for controlling the start and reset of the BIST function; in self-test, the test vector states of current operation are recorded in a corresponding self-test register; self-test results are recorded in the data bit corresponding to the BIST state register. The BIST circuit does not change the structure of an original protocol processor, is only provided with the BIST logic member and the read only memory for storing vectors, and can guarantee a high test coverage ratio, greatly mitigate the circuit test program development difficulty, and improve test efficiency.

Description

technical field [0001] The invention relates to a built-in self-test circuit, in particular to a built-in self-test circuit suitable for 1553 bus protocol. Background technique [0002] Since the birth of integrated circuits, design methods, manufacturing methods, and testing methods have always been the three inseparable components of integrated circuit development. But in the initial stage of integrated circuit development, people focused more on the field of design and manufacturing, and because the early integrated circuit logic design and process technology were relatively simple, the research on testing methods was once in a neglected position. With the continuous advancement of integrated circuit design methods and process technology, the functions realized by a single chip are becoming more and more complex, the work of circuit testing is becoming more and more difficult, and it is difficult to guarantee a high level of test coverage. Sexuality has become a factor t...

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Problems solved by technology

According to the DDC design manual, to achieve a test coverage rate of over 95%, about 4,000 test vectors nee

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