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EEG lie detection method based on multi-fractal elimination trend fluctuation analysis

A technology to eliminate trend fluctuations and multi-fractal spectrum, which is applied in electrical digital data processing, diagnostic recording/measurement, pattern recognition in signals, etc. It can solve the problems of information loss, non-linearity and chaotic characteristics of EEG signals, etc.

Active Publication Date: 2018-07-17
SHAANXI NORMAL UNIV
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Problems solved by technology

However, although the above processing method improves the signal-to-noise ratio of the evoked EEG signal under a single response, and intuitively reflects the difference between honest and deceitful behaviors, it does not take into account the nonlinear and chaotic characteristics of the EEG signal, resulting in partial information loss

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  • EEG lie detection method based on multi-fractal elimination trend fluctuation analysis
  • EEG lie detection method based on multi-fractal elimination trend fluctuation analysis
  • EEG lie detection method based on multi-fractal elimination trend fluctuation analysis

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Embodiment Construction

[0081] Such as figure 2 A kind of EEG lie detection method based on multifractal elimination trend fluctuation analysis shown, comprises the following steps:

[0082] Step 1, EEG polygraph judgment threshold setting: adopting the parameter setting unit 2 connected to the processor 1 to set the EEG polygraph judgment threshold of the EEG signal extraction device;

[0083] The EEG signal detection device includes a Pz electrode, and the Pz electrode is an EEG electrode arranged at the apex of the subject's head according to the international standard "10 / 20" electrode placement method;

[0084] The EEG polygraph judgment threshold of the EEG signal extraction device includes the EEG polygraph judgment threshold of the Pz electrode, and the EEG polygraph judgment threshold of the Pz electrode includes the Hurst index judgment threshold H Pz and multifractal spectrum width judgment threshold W Pz , where H Pz and W Pz are constants, H Pz =1.0142~1.0967, W Pz =0.894~1.11;

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Abstract

The invention discloses an EEG polygraph method based on multi-fractal elimination trend fluctuation analysis. The method comprises the following steps: 1. EEG polygraph judgment threshold setting: using a parameter setting unit connected to a processor to analyze the EEG signal The EEG polygraph judgment threshold of the extraction device is set; 2. EEG signal acquisition: use Pz electrodes to extract the EEG signals of the apex of the subject's head in real time, and use the EEG signal acquisition equipment according to the preset Sampling frequency f collects the EEG signals extracted by the Pz electrodes synchronously, and synchronously transmits the collected EEG signals to the processor; 3. EEG signal analysis and processing, the process is as follows: EEG signal reception and synchronous storage, EEG signal Signal feature extraction, lying or not judging and lying or not judging result output. The method of the invention has the advantages of simple steps, reasonable design, convenient implementation, good use effect, and can accurately detect the lying state simply and quickly.

Description

technical field [0001] The invention belongs to the technical field of electroencephalogram signal processing, in particular to an electroencephalogram lie detection method based on multifractal elimination trend fluctuation analysis. Background technique [0002] Polygraph technology, as an auxiliary means of judicial interrogation, plays an important role in the investigation and proof of the facts of criminal cases, and has been widely used. How to identify lies accurately and effectively is particularly important for the staff of the judiciary, and it is of great practical significance to study the detection methods of lies. In 1912, the multi-conductor polygraph developed in the United States mainly used physiological changes such as respiration, pulse, blood pressure, and skin voltage to distinguish lies. Since the above parameters are easily affected by subjective factors, it is difficult to ensure the accuracy of the test results, false positives and The false negat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B5/0476A61B5/0484G06F19/00G06K9/00
CPCG16Z99/00A61B5/6814A61B5/72A61B5/7221A61B5/7235A61B5/7282A61B5/369A61B5/377G06F2218/02G06F2218/10G06F2218/12
Inventor 艾玲梅陈慧君
Owner SHAANXI NORMAL UNIV