LASIS waveband image registration method and system based on geometric model

A geometric model and band technology, which is applied in the field of LASIS band image registration method and system, can solve the problems of not giving a solution and reducing the quality of LASIS spectral imaging

Active Publication Date: 2016-06-22
WUHAN UNIV
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Problems solved by technology

For example, YannFerrec et al. systematically analyzed the factors that reduce the quality of LASIS spectral imaging, and pointed out that attitude flutter will directly affect the quality of the interferogram, but did not give a specific solution

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  • LASIS waveband image registration method and system based on geometric model
  • LASIS waveband image registration method and system based on geometric model
  • LASIS waveband image registration method and system based on geometric model

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Embodiment Construction

[0078] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0079] In order to achieve the above objectives, the technical solution of the present invention is a photogrammetry method based on a rigorous imaging geometric model to eliminate optical distortion and attitude flutter, which mainly includes two innovations. One is to equate the area array model into a multi-line array The second is to use two bands to detect flutter features, compensate for the aberrations caused by flutter in all bands, and improve the previous scheme of self-compensating flutter effects in each band.

[0080] Embodiments of the present invention take Tianjin area image (hereinafter referred to as A) as checking data, experiment is carried out to Japan Misawa City (hereinafter referred to as B) and two scene images (hereinafter referred to as C, D) near Ampeli, Australia, input in advance Corresponding auxiliary files generally incl...

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Abstract

The invention provides a LASIS waveband image registration method and system based on a geometric model. The method comprises steps of: enabling a LASIS imaging model to be equivalent to a multi-linear-array push-scan model, performing camera calibration, constructing a parallel observation value by using the overlapped area of different waveband images, detecting platform vibration by using the parallel observation amount of two wavebands, and compensating pixel offset caused by the vibration of other wavebands by using detected vibration features; updating the attitude information of the imaging model, aligning the refined new imaging model to the undistorted imaging model, and resampling the original image to achieve waveband image automatic registration. In a conventional method, every two wavebands are matched and cumulative errors exist in a constructed interference sequence so that a poor precision is presented. The method and system prevent the defect, achieve overall high-precision registration of interference sequence image, improve the conventional method in which each waveband is self-compensated, and greatly increase processing efficiency.

Description

technical field [0001] The invention belongs to the field of image processing of photogrammetry and remote sensing, and relates to a LASIS band image registration method and system based on a strict imaging geometric model and a parallel observation method to eliminate flutter. Background technique [0002] The Large Aperture Static Interferometric Imaging Spectrometer (LASIS) is a push-broom-based Fourier transform imaging spectrometer. This type of spectrometer has the characteristics of high stability, compact structure, etc., and has better performance in orbit. The spectral performance of the LASIS interferometer depends on the registration accuracy of images in different bands. However, due to the characteristics of joint space-time modulation, the imaging time of the same ground object in different bands is inconsistent during the imaging process. Once the satellite platform is disturbed, different Band image pixel positions have different effects. The attitude jitte...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/33
CPCG06T2207/10036
Inventor 李凡邵振峰
Owner WUHAN UNIV
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