A wavelength-resolved monitoring method based on liquid crystal on silicon

Abstract

The invention discloses a wavelength resolution monitoring method based on the liquid crystal on silicon (LCOS). On the basis of the LCOS, at the same bias voltage, incident light of different wavelength has different phase modulation characteristics, optical signals in an LCOS wavelength working range are analyzed and monitored, the wavelength can be measured under the condition that the wavelength of the incident light is unknown, and the wavelength resolution accuracy can be improved as the phase modulation accuracy is improved. The invention uses a few components, is simple and compact in system structure, less demanding for the light path collimation and capable of wavelength resolution without rigorous light path coupling and complex operation, also has characteristics irrelevant to the polarization state of the incident light, can further measure the polarization state of the incident beam while resolving the wavelength, and has a wide range of application.

Description

technical field [0001] The invention belongs to the technical field of wavelength resolution and monitoring, and more specifically relates to a wavelength resolution monitoring method based on silicon-based liquid crystals. ~1100nm, and communication band 1400~1700nm, etc.), wavelength resolution and monitoring of optical signals in the working band of liquid crystal on silicon. Background technique [0002] Wavelength is one of the basic characteristics of light, and wavelength resolution technology has important applications in many occasions. In the field of meteorology, according to the different scattering and absorption properties of fog and haze on visible light, fog and haze can be distinguished by distinguishing specific wavelengths; in the field of biological sciences, it is usually necessary to detect the wavelength of light reflected by objects to determine the specific wavelength. Wavelength, to analyze the material composition; in the field of optical fiber co...

AI Technical Summary

Problems solved by technology

However, these methods have high requirements on the alignment of the optical path, and all of them need to be controlled manually or mechanically. Every time a wavelength is measured, an adjustment is required. The steps are cumbersome, the test time is long, and the device structure is complex and expensive.

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