Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Partial differential equation-based nano-particle size measurement method

A partial differential equation and nanoparticle technology, applied in the field of nanoparticle size measurement, can solve problems such as unsatisfactory image segmentation effect

Active Publication Date: 2016-09-07
思腾合力(天津)科技有限公司
View PDF5 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Li et al. (see literature 3) proposed the DRLSE model, and Chan and Vese (see literature 4) proposed the CV model, but these two segmentation models are not ideal for image segmentation with weak edge objects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Partial differential equation-based nano-particle size measurement method
  • Partial differential equation-based nano-particle size measurement method
  • Partial differential equation-based nano-particle size measurement method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0055] The present invention will be further described in detail below in combination with specific embodiments.

[0056] Processing and analyzing nanoparticle images based on image processing technology is an important method for nanoparticle size measurement, and individual particle segmentation is a key step in particle size measurement. Due to the uneven gray scale of nanoparticles in TEM images, and the edges of some particles are weak, it is very important to accurately segment individual particles. In recent years, a branch of image processing methods for partial differential equations—the level set image segmentation method has become a research hotspot. This method implicitly represents the edge evolution curve as a zero level set of a higher-dimensional function. The level set function is in Under the control of partial differential equations, it evolves until the zero level set evolves to the target boundary of the image. This kind of evolution has many advantages,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a partial differential equation-based nano-particle size measurement method. The method includes the following steps that: 1) a nano-particle image I is inputted, pixel-level multiplication is performed on the filtering result of a mean curvature flow model and a PM model, so that a filtered image u can be obtained; 2) a region scalable fitting (RSF) model is adopted to segment the image u; 3) pixel calibration is carried out, the actual size of each pixel in the image can be obtained; 4) inadherent particles are selected out by means of the convexity (Cconv) of a target; and 5) least-square circle fitting is performed on the boundaries of the particles, so that the diameters of spherical nano-particles can be obtained, and the diameter rc of the internally tangent circle of the nano-particles, the diameter ri of the externally tangent circle of the nano-particles, and the sphericity of the nano-particles are obtained, wherein the sphericity of the nano-particles can be represented by an expression S=ri / rc. The method of the invention can be widely applied to the high-tech fields such as catalytic science, medical drugs, new materials, electric power industry and compound materials which require nano-particle size measurement technology.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to a method for measuring the size of nanoparticles based on partial differential equations, which can be used for measuring the size of nanoparticles. Background technique [0002] Nanotechnology is widely used in catalytic science, medical drugs, new materials, electric power industry and composite materials, and plays an important role in the entire high-tech field (see Document 1). Since many characteristics of nanomaterials are closely related to their particle size, shape and other microstructures, the characterization of nanomaterials microstructure is of great importance for understanding the characteristics of nanomaterials, seeking the application fields of nanomaterials, and promoting the development of nanomaterials. important role, and the size measurement of nanoparticles is one of the key technologies. At present, methods for measuring the size of nanoparticle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/60G06T5/00G06T7/00
CPCG06T2207/20024G06T2207/10061G06T5/70
Inventor 张芳肖志涛王萌耿磊吴骏王雯陈颖
Owner 思腾合力(天津)科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com