Comprehensive stress acceleration test method

A comprehensive stress and accelerated test technology, which is applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of high cost and long test cycle, achieve small number of samples, reduce test cycle and cost, and ensure accuracy sexual effect

Active Publication Date: 2016-10-12
NO 60 RES INST OF GENERAL STAFF DEPT PLA
View PDF3 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a new type of comprehensive stress acceleration test method. According to the existing HALT test information or limit test information of the product, through the reasonable design of the test plan, and then based on the classic acceleration model, two kinds of Or a variety of accelerated stress model parameters, the equivalent failure data under the conventional comprehensive stress can be obtained after conversion of the acceleration factor, which can meet the needs of product reliability index verification or evaluation. Good features, to a certain extent, solve the problems of long test period and high cost in the past

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Comprehensive stress acceleration test method
  • Comprehensive stress acceleration test method
  • Comprehensive stress acceleration test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention is described in further detail below:

[0022] This implementation takes the simultaneous application of temperature and voltage as an example. Through the HALT test of the tested product, it is determined that its high temperature working limit is 90 °C, and through the performance limit test, its voltage limit is determined to be 32 VDC. If the stress exceeds these limit levels , which will lead to changes in the failure mechanism. In this implementation, the two stress levels are 4 test stress levels, so the test samples are divided into 7 groups, and the number of samples in each group varies from 2 to 4. According to the orthogonal test table , apply temperature-voltage comprehensive stress to each group of samples until all the tested samples in each group of samples fail, and record the failure time. The specific grouping and failure time (unit: min) are shown in the following table:

[0023]

[0024] the temperature S A =81℃ unchanged, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention discloses a comprehensive stress acceleration test method, comprising selecting failure stresses, such as S and S, having smaller coupling effects from all failure stresses S of a product as test comprehensive stress; determining the maximum stress levels S<max> and S<max> under the condition that the failure mechanism of the product is not changed according to existing test information or history similar product fault information; designing an orthogonal test based on the information according to reasonable selection of the test stress levels and reasonable selection of test samples; obtaining failure data t<hlk> of the samples under combination of different comprehensive stress levels; obtaining an acceleration model of the stress S satisfying product characteristics by fitting according to data of failure changes of the product along with changes of the magnitude of the stress S under the condition that the magnitude of the stress S is constant, and obtaining an acceleration model of the product under the stress S in the same way; obtaining acceleration model parameters under the various stresses; converting the failure data t<hlk> under the comprehensive acceleration stress into failure data t'<hlk> under the conventional comprehensive stress; and finally fitting a product fault probability distribution expression in a failure probability distribution manner, and completing verification or evaluation of indexes of product reliability.

Description

technical field [0001] The invention relates to a comprehensive stress acceleration test method, which belongs to the technical field of product component reliability and life evaluation. Background technique [0002] With the continuous progress of science and technology such as electronic components and materials, the reliability level of products is getting higher and higher. Due to the factors of long test time and high test cost, conventional test methods have been difficult to meet the needs of product reliability index verification. The accelerated test method has been widely used. It can accelerate the failure of the tested product by increasing the test stress without changing the failure mechanism of the product, so that the necessary information can be obtained in a short time to complete the verification of product reliability indicators or Evaluate. [0003] Most of the existing accelerated tests are to apply a single stress to compare the failure data of multi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
CPCG16Z99/00
Inventor 张逊唐军军姜年朝王克选宋军徐艳楠刘达
Owner NO 60 RES INST OF GENERAL STAFF DEPT PLA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products