Bicmos integrated circuit manufacturing method
A production method and integrated circuit technology, applied in the manufacture of circuits, electrical components, semiconductors/solid-state devices, etc., can solve problems such as the decline in product qualification rate, and achieve the effect of improving the qualification rate
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Embodiment 1
[0017] This embodiment provides a method for manufacturing a BiCMOS integrated circuit, which is used for manufacturing a BiCMOS integrated circuit. like figure 1 Shown is a schematic flow chart of the method for manufacturing a BiCMOS integrated circuit according to this embodiment.
[0018] In step 101, a first oxide layer is formed on the surface of the substrate, and the substrate includes a well region and a collector region.
[0019] The substrate in this embodiment may specifically be a silicon substrate, and the well region and the collector region may be arranged adjacent to each other. The first oxide layer is relatively thin, with a thickness ranging from 50 angstroms to 500 angstroms.
[0020] Step 102, forming a first photoresist layer on the surface of the first oxide layer.
[0021] A photoresist can be coated on the surface of the first oxide layer, and exposure, development and other processes are performed to remove the photoresist in the preset area and r...
Embodiment 2
[0037] like Figure 2A to Figure 2K Shown is a structural schematic view of each step in the above-mentioned BiCMOS integrated circuit manufacturing method.
[0038] like Figure 2A Shown is a schematic structural view of a substrate 201 , and the substrate 201 includes a well region 202 and a collector region 203 .
[0039] The substrate 201 in this embodiment may be a P-type substrate, the collector region 203 is N-type, and the well region is P-type.
[0040] A first oxide layer 204 is formed on the surface of the substrate 201 .
[0041] Specifically, a thermal oxidation process may be used to form the first oxide layer 204 on the surface of the substrate 201 . The thickness of the first oxide layer 204 is 50 Å-500 Å. The material of the first oxide layer may be silicon oxide.
[0042] like Figure 2B As shown, a photoresist is coated on the surface of the first oxide layer 204, and processes such as exposure and development are performed on the photoresist to form t...
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