Automatic focusing microscopic imaging system for planet surface material in-situ detection

Abstract

The invention provides an automatic focusing microscopic imaging system for planet surface material in-situ detection. The automatic focusing microscopic imaging system comprises a lighting unit, a microscopic imaging unit, an image acquisition unit, a focusing transmission unit and an upper computer unit; the lighting unit and the microscopic imaging unit are located in the same optical path; the microscopic imaging unit includes a microscope objective lens and a microscope lens barrel; the focusing transmission unit is a gear external-engagement transmission device; the arrangement direction of the focusing transmission unit is perpendicular to the lighting unit; the focusing transmission unit converts the transmission of gears to the movement of the microscope lens barrel; the image acquisition unit and the microscope lens barrel are in the same optical path; the image acquisition unit is connected with the focusing transmission unit; and the upper computer unit carries out definition judgment on an acquired image and controls the whole system to make the same in a focusing state. With the automatic focusing microscopic imaging system of the invention adopted, definition judgment can be carried out on the image of a sample to be detected; a focusing position can be found out quickly through a fitting a focusing function, and therefore, the speed and precision of focusing can be improved. Unitization design is adopted, so that the automatic focusing microscopic imaging system has the advantages of small size, strong function and so on.

Description

Technical field [0001] The invention belongs to the field of optical engineering, and in particular relates to an automatic focusing microscopic imaging device, which uses an image sharpness evaluation function to quickly realize a focusing process and obtain a clear microscopic image of a sample to be tested. Background technique [0002] In the field of deep space exploration, the microscopic imaging system is used as the optical load for in-situ detection. By imaging the surface soil and rock samples of planetary geology, according to the characteristics of image size, texture, color, etc., the topography and geomorphology can be recognized from a microscopic perspective, and then judged Soil element composition, mineral composition analysis, etc. Such as the microscopic imager (MI) carried by the US "Opportunity", the optical microscope (OM) carried by the "Phoenix" Mars lander, the MAHLI camera carried by the "Curiosity", and the ESA "ExoMars" carry MicroOmega hyperspectral...

AI Technical Summary

Problems solved by technology

[0003] When microscopic imaging loads obtain clear images, the traditional method is to image the samples to be tested at different object distances, and then select clear images from a series of images collected. This method collects more images and takes more time. long, inefficient

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