Tooling for testing embedded POS payment terminal motherboard and test method thereof

Abstract

The purpose of the invention is to provide a tooling for testing an embedded POS payment terminal motherboard and a test method thereof. The tooling comprises a tooling test frame base, and a tooling ejector plate, a tooling liquid crystal display module, a tooling motherboard, and a pressing plate linked with a pressing rod, which are mounted on the tooling test frame base. The tooling motherboard is equipped with a CPU, a Norflash and an SDRAM, and is further equipped with a board card AD identification module, a power supply voltage detection module, a power supply module, a liquid crystal display module, a serial communication module, and a GPIO interface. The test method comprises the following steps: S1, a board card waiting for test is put in the tooling for test, wherein the tooling judges the version of the board card; S2, the tooling sequentially tests the performances of the board card; and if the tested board card passes all tests in S2 and all performances are qualified, test ends. The tooling and the test method have the advantage that the efficiency of motherboard test is improved and the work efficiency is improved.

Description

technical field [0001] The invention relates to a tool for testing the motherboard of an embedded POS payment terminal and a testing method thereof. Background technique [0002] At present, there are many types of motherboards, such as computer mainframe motherboards, air conditioner motherboards, smart washing machine motherboards, etc. Various motherboards have different structures and working principles due to their different service objects, and the testing methods for solid motherboards are also different. At present Regarding the detection of the motherboard of the embedded pos payment terminal, electrical testing is mostly used. [0003] The most basic instrument used in electrical testing is the online tester. The traditional online tester uses a special needle bed to contact the components on the circuit board that have been soldered, and uses hundreds of millivolts of voltage and current within 10 milliamps. Carry out discrete isolation tests to accurately detect...

AI Technical Summary

Problems solved by technology

[0003] The most basic instrument used in electrical testing is the online tester. The traditional online tester uses a special needle bed to contact the components on the circuit board that have been soldered, and uses hundreds of millivolts of voltage and current within 10 milliamps. Carry out discrete isolation tests to accurately detect faults such as missed installation, wrong installation, solder joint welding, circuit board open circuit, short circuit, etc. of installed resistors, inductors, capacitors, triodes, integrated blocks, etc. Tell the user exactly which point is the device or the open circuit. The advantage of the bed of needles tester is that the test speed is fast, and it is suitable for the test of a single variety of civil home appliance circuit boards in a large scale. Improvement, especially the fine-pitch SMT assembly and new product development and production cycle are getting shorter and shorter, and there are more and more types of circuits. There are some insurmountable problems in the bed of needles online tester, and the production and debugging of the bed of needles fixture for testing have a long cycle , The price is expensive; for some high-density SMT circuit boards, it cannot be tested due to the problem of test accuracy

[0004] It is understood that the current tooling cannot be a tooling motherboard, corresponding to the application of testing multiple tested motherboards, often a set of tooling motherboards corresponds to a set of test motherboards, and it is often impossible to determine whether there is a short circuit on the tested motherboard during the tooling test In this way, there will be board burning during the test. In addition, the existing tooling test is to verify whether the board is soldered or short-circuited through the function. In this way, the test time will be relatively long and the efficiency will be low. advanced questions

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