Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An LFSR counter used for measuring photon flight time

A time-of-flight and counter technology, which is used in measurement devices, distance measurement, line-of-sight measurement, etc., can solve the problems of neglecting circuit structure simplification and innovation, and achieve the reduction of pixel circuit area, circuit area reduction, and accurate photon flight time. Effect

Inactive Publication Date: 2016-12-14
TIANJIN UNIV
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, as the mainstream counter structure of the current APD array 3D laser imaging, researchers often ignore the further simplification and innovation of its circuit structure, which leaves sufficient room for innovation in the present invention

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An LFSR counter used for measuring photon flight time
  • An LFSR counter used for measuring photon flight time
  • An LFSR counter used for measuring photon flight time

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments, and the described specific embodiments are only for explaining the present invention, and are not intended to limit the present invention.

[0021] Such as Figure 4 Shown is a kind of LFSR counter that is used for measuring photon time of flight that the present invention proposes, comprises 14 identical double edges C 2 MOS flip-flop, a four-input exclusive OR gate XNOR and a nmos set switch.

[0022] 14 identical double-edge C 2 The MOS flip-flops are respectively denoted as double-edge C 2 MOS flip-flop C 0 , double edge C 2 MOS flip-flop C 1 , double edge C 2 MOS flip-flop C 2 , double edge C 2 MOS flip-flop C 3 , double edge C 2 MOS flip-flop C 4 , double edge C 2 MOS flip-flop C 5 , double edge C 2 MOS flip-flop C 6 , double edge C 2MOS flip-flop C 7 , double edge C 2 MOS flip-flop C 8...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an LFSR counter used for measuring photon flight time. The LFSR counter comprises 14 identical double-edge C<2>MOS triggers C0-C13, a four-input exclusive-OR gate XNOR and an nmos setting switch. The source electrode of the nmos setting switch is an input control port VS, the grid electrode of the nmos setting switch is an input control port VG, the substrate of the nmos setting switch is connected with ground VSS; the drain electrode of the nmos setting switch is connected with an input end D of the double-edge C<2>MOS trigger C0. The counter employs fewer parts; the counter employs the double-edge trigger mode, so that the circuit area is reduced and the clock frequency is reduced; with the nmos setting switch, cumbersome design of feedback network combinational logic is prevented, a feedback network can be realized only by one four-input exclusive-OR gate, so that the circuit area is greatly reduced and the phenomenon of endless loop is prevented.

Description

technical field [0001] The invention belongs to the field of laser detection and readout circuits, in particular to an LFSR counter for measuring photon flight time. Background technique [0002] Active laser detection is a laser detection technology that uses a laser pulser to emit laser pulses to the target object to be detected, and calculates the distance to the target object by measuring the time between the echo pulse and the emitted pulse. In some special application fields, such as concealed military target detection, long-distance target detection and weak light target detection, etc., due to the requirements of detection concealment and the limitation of the target object's own lighting conditions, it is necessary to use high-sensitivity, fast-response Fast photodetectors are used for detection. Among the various photodetectors currently appearing, the Avalanche Photo Diode (APD) working in the Geiger mode can respond to a single photon and reach the limit of phot...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01S17/48H03K19/20H03K3/3562
CPCG01S17/48H03K3/3562H03K19/20
Inventor 赵毅强赵佳姮
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products