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Femtosecond laser length-measuring device and method based on frequency conversion interference principle

A femtosecond laser and length measuring device technology, which is applied to measuring devices, optical devices, instruments, etc., can solve problems such as unfavorable automation implementation, and achieve the effect of long measuring distance and simple method.

Active Publication Date: 2016-12-21
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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Problems solved by technology

[0006] The purpose of the present invention is to overcome the disadvantages of the existing femtosecond laser interferometric ranging method that the adjustment of coherent overlapping conditions between the measuring arm and the reference arm is relatively strict and unfavorable for automatic realization, and proposes a femtosecond laser based on the principle of frequency conversion coherent overlapping. Second laser length measuring device and method

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  • Femtosecond laser length-measuring device and method based on frequency conversion interference principle
  • Femtosecond laser length-measuring device and method based on frequency conversion interference principle
  • Femtosecond laser length-measuring device and method based on frequency conversion interference principle

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Embodiment 1

[0041] Such as figure 1 As shown, a femtosecond laser length measurement method and device based on the frequency conversion interference principle, including a femtosecond laser frequency comb (1) whose repetition rate can be controlled, a polarizer (2), a refracting mirror (3), a polarizing beam splitter ( 4), a precision displacement platform (5), a reference mirror (6), a measuring objective lens (7), a photoelectric detector (8), a data acquisition system (9), and a computer (10).

[0042] A femtosecond laser frequency comb (1) is used to generate a repetition rate f req The femtosecond laser, the polarizer (2) is used to adjust the laser polarization direction, the refracting mirror (3) is used to measure the light on the reflection side; the polarization beam splitter (4) divides the femtosecond laser into two, and respectively goes to the reference arm and the measuring arm, the precision displacement platform (5) is used to fine-tune the length of the arm of the refe...

Embodiment 2

[0061] Embodiment 2: Femtosecond laser interferometric distance measurement with fixed reference arm length and only frequency fine-tuning.

[0062] A femtosecond laser length measurement method and device based on the principle of frequency conversion interference, such as figure 2 As shown, it includes a femtosecond laser frequency comb (1) whose repetition rate can be controlled, a polarizer (2), a refracting mirror (3), a polarizing beam splitter (4), a reference mirror (6), a measuring objective lens (7), Photoelectric detector (8), data acquisition system (9), computer (10). The specific process is as follows:

[0063] Set the reference arm length of the measurement device to a fixed constant value L c .

[0064] The coherent overlapping phenomenon is obtained by adjusting the repetition frequency of the femtosecond laser frequency comb 1, assuming that the repetition frequency at this time is f rep = f 1 = 300MHz its "interference pitch" l p1 =c / f 1 =c / 300000000...

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Abstract

The invention relates to a femtosecond laser length-measuring device and method based on the frequency conversion interference principle, and belongs to the technical field of length measurement. The device comprises a femtosecond laser frequency comb with the controllable repetition frequency, a polaroid, an enoscope, a polarizing beam splitter, a precise displacement platform, a reference reflector, and so on. In use, the spatial coherent overlapping condition is obtained through the fine tuning of the pulse repetition frequency of the femtosecond laser frequency comb and the adjustment method of a reference arm, and there is no need to exert control and requirements on the number increase of the pitches. A spatial coherent overlapping measurement result at different co-prime repetition frequencies is used for solving an integer solution of an indefinite equation comprising the measured arm length and pitches, so as to obtain the number of pitches, thereby achieving a purpose of measuring a distance.

Description

technical field [0001] The invention relates to a femtosecond laser length measuring device and method based on the principle of frequency conversion interference, belonging to the technical field of length measurement. Background technique [0002] Length measurement technology is one of the most important basic engineering technologies for human beings. The current length measurement technology using the distance measurement method mainly includes two types: time method and space method. The spatial method mainly uses various rulers to directly measure distance and describe space, such as calipers, tape measures, steel tapes, etc., with limited distance and limited accuracy. The measurement method using the wavelength of light as a ruler is the usual interferometry method, which can achieve higher measurement accuracy and longer distances. The time method mainly relies on the measurement of the time required for various fluctuations to transmit in space or media. The spa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02
CPCG01B11/02
Inventor 梁志国武腾飞邢帅
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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