Multi-dimension complex calibrating method of fiber optic spectrometer

A technology of fiber optic spectrometer and calibration method, which is applied in the field of fiber optic spectrometer, can solve problems such as inconsistent response, poor temperature adaptability, and difficult calibration, and achieve the effect of improving stability and ensuring reliability

Active Publication Date: 2017-01-25
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

On the one hand, due to the limitation of the size of the CCD photosensitive element itself and the distribution error of the spectral band on the photosensitive surface, it is difficult to calibrate the wavelength on the CCD, which limits the improvement of the positioning accuracy of the spectral line on the CCD. Therefore, it is necessary to Calibration of wavelengths lateral to the spectral curve
On the other hand, due to the correlation between the diffraction grating, the quantum efficiency of the array CCD detector, the packaging material, etc. To accurately reflect the intensity distribution characteristics of the op

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  • Multi-dimension complex calibrating method of fiber optic spectrometer
  • Multi-dimension complex calibrating method of fiber optic spectrometer
  • Multi-dimension complex calibrating method of fiber optic spectrometer

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Embodiment Construction

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0049] Due to the high and low temperature conditions, the performance of the CCD has improved or decreased, and the optical components in the optical path have deviated from their original positions due to thermal expansion and contraction, resulting in large deviations in the test results of wavelength and amplitude. Therefore, the present invention needs to solve the problems of wavelength calibration and amplitude calibration of the fiber optic spectrometer...

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Abstract

The invention discloses a multi-dimension complex calibrating method of a fiber optic spectrometer. The calibrating method comprises the steps of multi-dimension wavelength calibration and multi-dimension amplitude calibration, wherein multi-dimension calibration is executed to the wavelength and the amplitude by introducing temperature factors so that stability of the spectrometer is increased at high and low temperature; in the calibrating method, various operating factors of CCD (Charge Coupled Device) are fully considered, and multi-dimension complex calibration is executed to the fiber optic spectrometer in combination with multiple dimensional calibration factors of space, time, temperature and light intensity to ensure reliability of test results.

Description

technical field [0001] The invention relates to the field of fiber optic spectrometers, in particular to a multi-dimensional complex calibration method for fiber optic spectrometers. Background technique [0002] In the fiber optic spectrometer, a fixed grating structure is used, and a linear array CCD is used as a detector in the spectral imaging spectrum. On the one hand, due to the limitation of the size of the CCD photosensitive element itself and the distribution error of the spectral band on the photosensitive surface, it is difficult to calibrate the wavelength on the CCD, which limits the improvement of the positioning accuracy of the spectral line on the CCD. Therefore, it is necessary to Calibration is carried out at wavelengths lateral to the spectral curve. On the other hand, due to the correlation between the diffraction grating, the quantum efficiency of the array CCD detector and the packaging material, etc. To accurately reflect the intensity distribution c...

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Application Information

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IPC IPC(8): G01J3/28G01J3/02
CPCG01J3/0297G01J3/28G01J3/2803G01J2003/282G01J2003/2879
Inventor 吴威聂建华宋平鞠军委杨鹏项国庆董杰韩顺利
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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