Self-calibration method and system of IC lock frequency

Abstract

The invention provides a self-calibration method and system of IC lock frequency, and relates to the technical field of electronics. The method comprises the following steps: periodically receiving test pulse input signals with a rated time length input by a test circuit, and counting the test pulse input signals by using a to-be-tested clock as the working clock; comparing a current counting value with a pre-stored rated counting value to calculate a frequency deviation of the to-be-tested clock; judging whether the frequency deviation is greater than a preset frequency error threshold; and selecting a corresponding frequency adjustment mode according to a judgment result to calibrate the clock frequency of the IC, wherein the frequency adjustment mode comprises fine frequency tuning and coarse frequency tuning. By adoption of the self-calibration method and system provided by the invention, the self-calibration of the IC lock frequency can be realized without requiring an external test device to carry an accurate frequency indicator or write the frequency deviation in the IC through a test communication pin, moreover, the test time can be shortened, the test efficiency and the calibration accuracy are improved, and the test cost is lowered.

Description

technical field [0001] The invention belongs to the field of electronic technology, in particular to a method and system for self-calibrating an IC clock frequency. Background technique [0002] In the IC (Integrated Circuit, integrated circuit) industry, IC testing costs account for a very important part of the total cost of IC production, and the proportion of testing costs in the total cost of circuits and systems continues to rise. The cost of testing is directly proportional to the time it takes to test. In IC production design, how to reduce the test cost of IC has become an important topic nowadays. In the production test of IC, the test and calibration of the clock frequency of IC is a link that is often required in IC test. Only when the clock frequency is accurate can the function and performance of IC be guaranteed. [0003] At present, the clock frequency test and calibration scheme of IC is generally as follows: output the clock to be corrected through the tes...

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Problems solved by technology

[0004] The object of the present invention is to provide a method and system for IC clock frequency self-calibration, aiming at solving the above-mentioned IC clock frequency test and calibration scheme needs external test equipment with accurate frequency meter, the time required for testing is relatively long and Due to the limited test resources on the test equipment, the number of ICs that the test equipment can support in one test is limited, resulting in relatively low test efficiency.

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