Terahertz frequency band power amplifier chip on-chip power test system and test method

Abstract

The present invention proposes a terahertz (THz) frequency band power amplification chip-on-chip power test system, the structure of which includes a processor, a probe station, a signal source, a spread spectrum module, a power meter, a power supply, a left S-bend and a waveguide probe. Needle, right S-curve and waveguide probe, DC probe card. The test method includes: 1) Establishing the corresponding relationship between the output power of the signal source and the output power of the spread spectrum module; 2) Connecting the left and right S-bends and waveguide probes on the basis of the original system; 3) Testing the on-chip system loss; 4) Collect data; 5) The processor calculates the input power, output power and gain of the terahertz band power amplifier chip to be tested; 6) Determines whether other chips need to be tested. Advantages: 1) Accurate testing of output power and gain of THz power amplifier chips is realized; 2) On-chip automatic testing of THz power amplifiers is realized, which improves test efficiency.

Description

technical field [0001] The invention relates to a terahertz frequency band power amplification chip on-chip power testing system and a testing method. The method is suitable for related testing of power amplifying chips in the terahertz frequency band, and belongs to the field of chip testing in microwave communications. Background technique [0002] Terahertz (THz) waves refer to electromagnetic waves with a frequency in the range of 100GHz-10THz, which are between microwaves and light waves. They have the characteristics of short wavelength, high transmittance, and wide bandwidth. Communication and other aspects have broad application prospects, and have important application directions in the field of radar system military electronics, such as high-precision radar, anti-stealth radar, secure communication and terahertz imaging detection. [0003] The terahertz power amplifier chip is the cornerstone supporting the entire terahertz solid-state system, and is the basis and ...

AI Technical Summary

Problems solved by technology

[0004] The present invention proposes a terahertz frequency band power amplifier chip on-chip power test system and test method, the purpose of which is to avoid the problem of low efficiency of the rack test, and at the same time realize the test of parameters such as the output power and gain of the THz band power amplifier chip , to improve test accuracy

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