Super-resolution optical microscopic imaging method based on particle scattered light near-field lighting

Abstract

The invention relates to a super-resolution optical microscopic imaging method based on particle scattered light near-field lighting. Particle scattered light is used as the lighting source of a microscope based on an existing dark field optical microscope, and an area lighted by the scattered light can acquire spatial resolution beyond the diffraction limit so as to realize spatial super-resolution imaging. Compared with the common bright field or dark field microscope, the method has higher spatial resolution. Compared with the near-field scanning optical microscope, scanning is performed on the surface of a sample through micrometer particles so that the super-resolution image of the surface of the whole sample can be acquired, the method has higher imaging speed without performing point-by-point scanning on the surface of the sample, and the range of each time of imaging can be 10 <mu>m2.

Description

Technical field [0001] The invention relates to an optical microscopic imaging technology, in particular to a super-resolution optical microscopic imaging method based on near-field illumination of particle scattered light. Background technique [0002] Far-field optics is limited by the optical diffraction limit, and the spatial resolution of its imaging system depends on the incident wavelength and the numerical aperture of the microscope objective, and is usually not less than half of the incident light wavelength. To break through the diffraction limit, the most commonly used technique is the near-field scanning optical microscope. This technology uses porous or non-porous probes located within a range of hundreds of nanometers above the sample surface to collect the intensity of evanescent waves on the sample surface, thereby obtaining profile information of the sample. The resolution is theoretically determined by the probe size, and currently it can reach a spatial resolu...

AI Technical Summary

Problems solved by technology

[0004] The present invention aims at the problem that the imaging speed of the current near-field scanning optical microscope is limited, and proposes a super-resolution optical microscopic imaging method based on particle scattered light near-field illumination. Compared with the point-by-point scanning near-field scanning optical microscope, This solution has faster imaging speed and can also obtain spatial resolution beyond the diffraction limit

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