Step p-GaN enhanced AlGaN/GaN heterojunction field effect transistor

A heterojunction field effect, enhanced technology, applied in semiconductor devices, electrical components, circuits, etc., can solve problems such as threshold voltage and output current reduction, device avalanche breakdown, reliability reduction, etc., reaching the breakdown voltage Increased, peak electric field drop increased, easy to make effects

Inactive Publication Date: 2017-05-31
XIDIAN UNIV
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Problems solved by technology

[0007] In order to solve the device avalanche breakdown and current collapse effect caused by the peak electric field at the gate edge of the p-GaN enhanced AlGaN / GaN heterojunction field effect transistor in the prior art, the threshold voltage and output current are reduced, and the reliability reduce a series of problems, the present invention provides a novel p-GaN enhanced AlGaN / GaN heterojunction field effect transistor

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  • Step p-GaN enhanced AlGaN/GaN heterojunction field effect transistor
  • Step p-GaN enhanced AlGaN/GaN heterojunction field effect transistor

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Embodiment Construction

[0034] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, a detailed description will be given below in conjunction with the accompanying drawings and specific embodiments.

[0035] Aiming at the problem that there is a peak electric field at the gate edge of the existing p-GaN enhanced AlGaN / GaN heterojunction field effect transistor, the present invention provides a novel enhanced AlGaN / GaN heterojunction field effect transistor with stepped p-GaN .

[0036] Its structure is as figure 1 As shown, it mainly includes: semi-insulating substrate 0; heteroepitaxially grown AlN nucleation layer 1 on the semi-insulating substrate; GaN buffer layer 2 epitaxially grown on the AlN nucleation layer; epitaxially grown on the GaN buffer layer AlGaN barrier layer 3; p-type GaN dielectric layer 4, drain 5 and source 6 located on the AlGaN barrier layer; gate 7 located on the p-type GaN dielectric layer; located on the...

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Abstract

The invention discloses a step p-GaN enhanced AlGaN/GaN heterojunction field effect transistor. According to the transistor structure, a p type GaN cap layer is introduced into the transistor grid edge, and the thickness of the cap layer is smaller than that of a p type GaN dielectric layer under a grid. The p type GaN cap layer can lower the two-dimensional electron gas concentration of a conducting channel in the area, and the electric field modulation effect is achieved. By generating a new electric field peak, a high electric field at the grid edge is lowered, and electric field distribution on the surface of the transistor is more uniform. Compared with a traditional p-GaN enhanced structure, the step p-GaN enhanced AlGaN/GaN heterojunction field effect transistor is obviously raised and improved in the aspects of breakdown voltage and reliability.

Description

technical field [0001] The invention relates to the technical field of semiconductor devices, in particular to a p-GaN enhanced AlGaN / GaN heterojunction field effect transistor. Background technique [0002] Due to the limitations of the first-generation and second-generation semiconductor materials represented by Si and GaAs, the third-generation wide-bandgap semiconductor materials have been developed rapidly because of their excellent performance. As one of the cores of the third-generation semiconductor materials, GaN material is special in its polarization effect compared with Si, GaAs and SiC. Taking advantage of this particularity, people have developed AlGaN / GaN high electron mobility transistors, and AlGaN / GaN HEMTs are GaN-based microelectronic devices based on AlGaN / GaN heterojunction materials. The AlGaN / GaN heterojunction forms a high-density two-dimensional electron gas (2DEG) at the heterojunction interface through spontaneous polarization and piezoelectric p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/06H01L29/778
CPCH01L29/7787H01L29/063
Inventor 段宝兴谢慎隆郭海君袁嵩杨银堂
Owner XIDIAN UNIV
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