Surface temperature real-time measurement device in optical film damage process

Abstract

The invention provides a surface temperature real-time measurement device in the optical film damage process. The measurement device includes a laser system, a sample to be tested on a mobile platform controlled by a computer, a CCD online damage determination device, and two Si avalanche photodiode detectors and one oscilloscope for measuring thermoreflectance signals. By means of two different lasers, one is a nanosecond pulse main laser irradiating the optical film to induce the damage of the optical film, the other one is a detection laser irradiating the sample surface at a certain angle with the main laser, and the thermoreflectance signals of the detection laser on the surface of the optical film in real time are detected to measure the real-time change of the temperature in the damage process of the optical film induced by the main laser. The system can measure the surface temperature in the nanosecond pulse laser induced optical film damage process and provides an experimental basis for the determination of the nanosecond pulse laser induced optical film damage mechanism.

Description

technical field [0001] The invention relates to the technical field of laser damage measurement of optical thin films, in particular to a device for real-time measurement of surface temperature in the process of nanosecond pulse laser-induced damage to optical thin films. Background technique [0002] The damage of optical thin films has restricted the development of high-power lasers for many years. The key to solving the above problems is to study the detection of thin film damage and provide a good measurement method. [0003] The research on the laser damage mechanism of optical thin films is the basis for the preparation of high-quality optical thin films, and the laser-induced damage mechanism can only be deeply understood by understanding the changes in optical, thermal, and mechanical properties of optical thin films during the damage process. Thermal damage is the main damage process of nanosecond pulsed laser-induced optical thin films, so real-time measurement of ...

AI Technical Summary

Problems solved by technology

Most of the measurements are an indirect measurement, generally by measuring the absorption of optical films under laser irradiation, and then consider that the absorbed light energy is converted into heat energy and then reverse the corresponding changes in surface temperature through heat conduction theory, and The measurement of this absorption is generally that the optical film is not damaged under laser induction, because once the optical film is damaged, its absorption will increase significantly and may be several orders of magnitude higher, so this measurement method is limited.

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