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Image Nonuniformity Correction Method Based on Laplace Operator and Deconvolution

A non-uniformity correction and deconvolution technology, applied in image enhancement, image data processing, calculation, etc., can solve the problems of low correction accuracy and weak robustness, and achieve simple calculation, strong robustness and strong performance. The effect of engineering application value

Active Publication Date: 2019-08-23
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0005] In order to solve the problems of low correction accuracy and weak robustness in the existing non-uniformity correction methods, the present invention proposes an image non-uniformity correction method based on Laplace operator and deconvolution

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  • Image Nonuniformity Correction Method Based on Laplace Operator and Deconvolution
  • Image Nonuniformity Correction Method Based on Laplace Operator and Deconvolution
  • Image Nonuniformity Correction Method Based on Laplace Operator and Deconvolution

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[0051] combine Figure 2 to Figure 4 This example will be described. In this example, an image non-uniformity correction method based on the Laplace operator and deconvolution of the present invention is applied to the principle prototype. The principle prototype includes an optical lens with a focal length of 38mm and a cooled long-wave infrared detector produced by Sofradir. Among them, the detector resolution is 320 × 256, and the response band is 7.7-11.3 μm.

[0052] First, use the turntable to continuously change the azimuth angle of the principle prototype, collect and store 1001 frames of original infrared images, one of which is as follows: figure 2 shown.

[0053] Secondly, the above 1001 frames of original images are convolved with the Laplace convolution kernel in formula (3), and the boundary of the image is symmetrically extended.

[0054] Again, for the convolved image, calculate the median of the 1001 values ​​corresponding to each pixel to get the median m...

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Abstract

The present invention provides a method for correcting image non-uniformity based on Laplace operator and deconvolution. The specific process is as follows: Step 1. For the F frame image to be corrected, use Laplace operator to perform convolution processing on it; Step 2. Take the median value of the same pixel of the F frame image after convolution, and obtain the median matrix after pixel-by-pixel calculation; Step 3, based on the median matrix, use the deconvolution algorithm to calculate the correction coefficient matrix b; use the correction coefficient Matrix b corrects the image to be corrected. Based on the assumption that four adjacent pixels have statistical consistency, the present invention performs convolution on the image, takes the median value, and finally calculates the correction coefficient matrix for correction. This method can correct high-frequency components and low-frequency components in non-uniform noise, There is no need to pre-store the correction coefficient based on the calibration method, thereby completely solving the problem of the detector radiation response drifting with time.

Description

technical field [0001] The invention belongs to the technical field of infrared focal plane imaging, and in particular relates to an image non-uniformity correction method based on Laplace operator and deconvolution. Background technique [0002] Long-wave infrared detectors have the characteristics of simple structure, small size, high sensitivity and passive imaging, and are widely used in industry, agriculture, medical treatment, forest fire prevention and national defense and other fields. Due to the limitations of semiconductor materials and process conditions, the radiation response of each pixel is different, resulting in serious non-uniform noise interference on the detector, reducing the spatial resolution of the system and seriously affecting the imaging quality of the system. Compared with linear array detectors, infrared focal plane arrays are more susceptible to non-uniformity noise; compared with short-wave and mid-wave infrared detectors, long-wave infrared de...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06T5/20
CPCG06T5/20G06T2207/10048G06T5/70
Inventor 王德江周达标霍丽君刘让贾平
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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