System for testing electrothermal characteristics of LED light, and application of system

A technology for testing systems and thermal characteristics, which is applied in diode testing, optical performance testing, single semiconductor device testing, etc. It can solve problems such as large testing errors, low measurement accuracy, and complicated measurement processes, and achieve accurate temperature/voltage relationships and improve The accuracy of the test and the effect of the simple test process

Inactive Publication Date: 2017-08-04
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The pin temperature method needs to measure the pin temperature, chip power dissipation and thermal resistance coefficient. Because the chip power dissipation and thermal resistance coefficient are inaccurate, the measurement accuracy is relatively low; the infrared imaging method can only test unpackaged chips, which cannot be realized. Non-destructive measurement of LED devices. At the same time, infrared imaging technology is affected by factors such as the light emissivity of the tested LED device and environmental humidity, and the test error is relatively large; the luminescence spectrum peak shift method requires high resolution of the spectrometer. It is difficult to measure the accuracy, and the measurement accuracy and repeatability are relatively low; the voltage method is to set a constant ambient temperature under a specific current, so that the LED junction temperature

Method used

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  • System for testing electrothermal characteristics of LED light, and application of system
  • System for testing electrothermal characteristics of LED light, and application of system
  • System for testing electrothermal characteristics of LED light, and application of system

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0045] Example 1

[0046] Such as figure 1 Shown.

[0047] A test system for LED photoelectric thermal characteristics, including a computer, a power supply module, an electrothermal test module, and an optical test module; the computer is respectively connected with the power supply module, the electrothermal test module and the optical test module; the power supply module is also respectively connected with the electrothermal test module Connect with optical test module.

Example Embodiment

[0048] Example 2

[0049] Such as figure 2 Shown.

[0050] The LED photoelectric thermal characteristics test system described in embodiment 1, the difference is that the power module includes a power meter and a power supply; the electrothermal test module includes a constant temperature chamber, a heating device and a temperature controller, and a constant temperature chamber An LED is provided inside; the optical test module includes an integrating sphere and a spectrometer; the power meter is connected to a computer and an LED, and the computer is connected to the heating device through a power supply; the temperature controller is connected to the heating device and the computer respectively; The integrating sphere is respectively connected with a spectrometer and an LED, and the spectrometer is connected with a computer. When measuring the relationship between I / V and temperature, the power meter supplies LED pulse current. When measuring the spectrum, the power meter suppl...

Example Embodiment

[0052] Example 3

[0053] The test system for the photoelectric and thermal characteristics of the LED as described in embodiment 2, except that the integrating sphere is provided with an LED lamp holder.

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Abstract

The invention relates to a system for testing the electrothermal characteristics of LED light, and an application of the system. The system comprises a computer, a power module, an electrothermal testing module and an optical testing module. The computer is connected with the power module, the electrothermal testing module and the optical testing module. The power module is also connected with the electrothermal testing module and the optical testing module. The system improves a voltage method, measures a plurality of temperatures and different currents under the same temperature, obtains the more precise temperature/voltage relation, and improves the testing accuracy.

Description

technical field [0001] The invention relates to a testing system for the photoelectric and thermal characteristics of LEDs and an application thereof, belonging to the technical field of LED performance testing. Background technique [0002] Compared with traditional light sources, LED has many advantages, and has become the most promising solid light source at present, and is widely used in various fields of production and life. How to quickly and accurately test the optical characteristics of LEDs under different electrothermal conditions plays an important role in the rapid development of the LED industry, and the measurement of LED junction temperature is an important part of testing the photoelectric and thermal characteristics of LEDs. [0003] At present, the testing methods of LED junction temperature mainly include pin temperature method, infrared imaging method, luminous spectrum peak shift method and voltage method. The pin temperature method needs to measure the...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01M11/02
CPCG01M11/02G01R31/2635
Inventor 孔繁敏张宁
Owner SHANDONG UNIV
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