An infrared image non-uniformity correction device and correction method thereof

Abstract

The invention discloses an infrared image non-uniformity correction device and a correction method thereof. Firstly, the core is exposed in a high and low temperature box and is calibrated by putting it in a casing to obtain different environments in the two cases. The response of the core corresponding to the temperature, and record the response corresponding to the detector substrate temperature and structure temperature; then calibrate the two high-temperature images against the blackbody, calculate the non-uniformity correction parameter K, and compare K with the calibrated without baffle The results are stored in FLASH; during work, read out the background value in the FLASH module according to the substrate temperature, then calculate the background corresponding to the current substrate and structure temperature, and then perform non-uniformity correction output on the input image. The beneficial effects achieved by the present invention are as follows: when simulating the working situation of the infrared imaging system, the calibration without the barrier is completed; the background parameters are calculated by real-time interpolation during operation, and the non-uniformity correction of the image is completed without the barrier, improving the Image quality while reducing mechanical structure, reducing system power consumption and noise.

Description

technical field [0001] The invention relates to a device for correcting non-uniformity of an infrared image without a baffle and a correction method thereof, and belongs to the technical field of infrared image processing. Background technique [0002] Since the 1990s, infrared technology is undergoing a third revolution, and uncooled infrared imaging technology represented by microbolometers and pyroelectric detectors has achieved important breakthroughs and achieved practical application. It not only solves the most prominent requirement of low temperature (~77K) cooling work in infrared imaging technology, but also realizes large-scale or ultra-large-scale integration with the readout circuit like photonic semiconductor infrared focal plane array technology, realizing high Density, miniaturization, portability and easy-to-operate thermal imaging cameras. [0003] However, affected by the material and process of infrared detectors, the non-uniformity of infrared focal pla...

AI Technical Summary

Problems solved by technology

However, a few seconds of blindness will occur when the baffle is under the cover. In a fast-moving workplace, it is not conducive to observing the surrounding conditions, and the introduction of the baffle into the mechanical structure will increase the power consumption and noise of the system.

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