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Method for quickly identifying random code signals of CMOS sensors after irradiation

An oxide semiconductor and complementary metal technology, applied in the field of image sensor detection, radiation hardening, and microelectronics, can solve the problems of long-term, inability to obtain information threshold size of random code signal noise, not universal, etc.

Active Publication Date: 2019-08-06
XINJIANG TECHN INST OF PHYSICS & CHEM CHINESE ACAD OF SCI
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Problems solved by technology

The main disadvantage of the observation and counting method is that it cannot be detected automatically and relies too much on the accuracy of the operator.
The threshold-based detection method is the fastest way to detect random code signals, but this method cannot obtain the information of random code signal noise and its threshold value is not universal, it should be selected according to specific devices and test conditions
Although the detection method of histogram analysis can better meet the various requirements of detection, this method takes a long time and leads to low detection efficiency of random code signals

Method used

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  • Method for quickly identifying random code signals of CMOS sensors after irradiation
  • Method for quickly identifying random code signals of CMOS sensors after irradiation
  • Method for quickly identifying random code signals of CMOS sensors after irradiation

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Embodiment

[0027] The method for quickly identifying the random code signal of a complementary metal oxide semiconductor sensor after irradiation according to the present invention involves a device consisting of an electrostatic test platform, a sample test board, a sample of a complementary metal oxide semiconductor sensor and a computer. A sample test board 2 is placed on the platform 1, a complementary metal oxide semiconductor sensor sample 3 is placed on the sample test board 2, and the sample test board 2 is connected to the computer 4 through a USB data cable. The specific operation is carried out according to the following steps:

[0028] a. Select the MT9M001 complementary metal oxide semiconductor sensor produced by AptinaTM company as the complementary metal oxide semiconductor sensor sample 3. First, the energy is 23 MeV and the cumulative fluence is 14.8×10 10 p / cm 2 The protons irradiate the CMOS sensor sample 3, and then place the irradiated CMOS sensor sample 3 in an env...

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Abstract

The invention relates to a method for quickly identifying random telegraph signals of an irradiated complementary metal oxide semiconductor sensor. A device used in the method is composed of a static test platform, a sample test plate, a complementary metal oxide semiconductor sensor sample, and a computer. The method comprises the following steps: collecting a large number of dark field images using graph reading software installed on the computer, and converting image data into signals of which the gray values change with time; rearranging the obtained pixel signals of which the gray values change with time, and calculating out gradient information; filtering the gradient information of the pixel signals; carrying out reconstruction based on the filtered gradient signals and the original rearranged signals to get reconstructed signals; calculating the amplitude of fluctuation and the number of steps of the signals; and performing OR relational operation on the judgment result of the unfiltered signals based on a specific criterion and the judgment result of the filtered signals based on a specific criterion to get a result, wherein whether a pixel is a random telegraph signal can be judged correctly based on the result. The method is convenient and quick to operate, and is of certain versatility.

Description

technical field [0001] The invention relates to the technical field of image sensor detection, in particular to a method for rapidly identifying random code signals of complementary metal oxide semiconductor sensors after irradiation, and belongs to the technical field of microelectronics and the field of anti-radiation reinforcement technology. Background technique [0002] In recent years, the space application of complementary metal oxide semiconductor sensors involves the fields of earth survey, remote sensing imaging, star image acquisition functions such as star sensors, and space exploration and navigation such as spacecraft visualization systems. The reliability of its space application has an important impact on the on-orbit performance and operational life of the satellite. [0003] The random code signal means that the dark current of the image sensor presents a series of transiently separated fluctuations, which appear randomly on two or more steps. Random code ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00
CPCG01D18/00
Inventor 冯婕张翔文林马林东李豫东郭旗
Owner XINJIANG TECHN INST OF PHYSICS & CHEM CHINESE ACAD OF SCI
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