Method for quickly identifying random code signals of CMOS sensors after irradiation
An oxide semiconductor and complementary metal technology, applied in the field of image sensor detection, radiation hardening, and microelectronics, can solve the problems of long-term, inability to obtain information threshold size of random code signal noise, not universal, etc.
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[0027] The method for quickly identifying the random code signal of a complementary metal oxide semiconductor sensor after irradiation according to the present invention involves a device consisting of an electrostatic test platform, a sample test board, a sample of a complementary metal oxide semiconductor sensor and a computer. A sample test board 2 is placed on the platform 1, a complementary metal oxide semiconductor sensor sample 3 is placed on the sample test board 2, and the sample test board 2 is connected to the computer 4 through a USB data cable. The specific operation is carried out according to the following steps:
[0028] a. Select the MT9M001 complementary metal oxide semiconductor sensor produced by AptinaTM company as the complementary metal oxide semiconductor sensor sample 3. First, the energy is 23 MeV and the cumulative fluence is 14.8×10 10 p / cm 2 The protons irradiate the CMOS sensor sample 3, and then place the irradiated CMOS sensor sample 3 in an env...
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