Single event error rate cross-section prediction method for radiation-resistant complex integrated circuits

Abstract

The invention relates to an estimation method for a single-particle error rate section of a radiation-proof complex integrated circuit. According to the technical scheme, a ground full-function test program is compiled according to system functions of the circuit; the circuit is divided into multiple modules according to the principles that duty factors are equal, radiation effect types are the same, and a physical layout can be divided; the duty factors of all the modules in a ground accelerated test are solved; a single-particle error rate section estimation model is established according to the correlation between the single-particle error rate section of the whole circuit, single-particle intrinsic error sections of all the modules and the duty factors; the radiation-proof performance of the radiation-proof complex integrated circuit under a space application program can be estimated through the model; and the worst single-particle error rate section of the ground is estimated according to the maximum duty factor of each module. Therefore, pre-estimation of the single-particle error rate section of the radiation-proof complex integrated circuit is realized, and a reference basis is provided for spatial engineering application model selection of the radiation-proof complex integrated circuit.

Description

technical field [0001] The invention belongs to the technical field of radiation-resistant complex integrated circuits, and in particular relates to a method for estimating the single-event error rate cross-section of radiation-resistant complex integrated circuits, which can be used to evaluate the radiation-resistant performance of aerospace microelectronic devices. Background technique [0002] With the rapid development of my country's aerospace technology and integrated circuit technology, the integration of radiation-resistant integrated circuits for aerospace has been continuously improved, showing the characteristics of many modules, large scale, high integration, and complex structure. Radiation-resistant complex integrated circuits are often attacked by cosmic charged particles when they are in orbit in space, resulting in circuit function output errors or even functional failures. How to reasonably predict the performance of complex integrated circuits for aerospac...

AI Technical Summary

Problems solved by technology

Radiation-resistant complex integrated circuits are often attacked by cosmic charged particles when they are in orbit in space, resulting in circuit function output errors or even functional failures. How to reasonably predict the performance of complex integrated circuits for aerospace from ground simulation acceleration tests? Anti-irradiation performance is a new challenge in the field of single-event performance evaluation of anti-irradiation complex integrated circuits

[0003] Traditional single event performance evaluation methods for complex integrated circuits based on ground simulation acceleration tests mainly use built-in self-test structures or typical operating modes to evaluate their single event error rate cross-sections. Internally establish a specific test structure, such as SCAN chain, MBIST, etc., to test the internal storage unit separately; the radiation resistance performance of the internal logic part of the circuit is only evaluated separately in the typical working mode; none of the above methods have anti-radiation According to the overall radiation resistance performance of complex integrated circuits in the ground simulation accelerated test environment, a more reasonable evaluation can be made

[0004] The radiation resistance performance evaluation method of the radiation-resistant complex integrated circuit in the traditional space environment is mainly based on the estimation of the single event error rate cross-section under the single full-function test program on the ground, without considering the working mode of the circuit in the specific space environment and the internal The impact of resource utilization makes the evaluation results often far from the actual results

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