A Calculation Method of Vertical Projection Grating Measurement Simulation System

Abstract

The invention relates to a vertical projection raster measurement simulation system and a realization method thereof, belonging to the structure light measurement technology field. The vertical projection raster measurement simulation system and realization method thereof take a windows system as a development platform, adopts a backlight ray tracking method, uses a computer programming language to write a raster projection module, a working platform module and an image collection module, simulates a measured object and realizes a simulation model having a raster projection measurement system, wherein a simulated projector is perpendicular to a reference plane and optical axes of a projector and a camera have no intersection points. The vertical projection raster measurement simulation system of the invention does not need a fact that the optical axis of the projector is intersected with the optical axis of a camera on one point and can realize simulation of an optical-axis-crossing type raster projection measurement system.

Description

technical field [0001] The invention relates to a solution method for a vertical projection grating measurement simulation system, in particular to a structured light projection simulation system using a computer to simulate the grating modulation process in reality and an implementation method thereof, belonging to the technical field of structured light measurement. Background technique [0002] With the rapid development of science and technology and the continuous improvement of social productivity, the demand for measurement technology in various fields is also increasing, especially the requirements for its measurement method, measurement efficiency and measurement accuracy become more stringent. With computing technology. With the rapid development of optical measurement technology and digital image processing technology, three-dimensional shape measurement methods emerge in endlessly. Structured light measurement technology stands out among many measurement methods ...

AI Technical Summary

Problems solved by technology

At present, the ray tracing method is widely used in the field of optical simulation, but there are still many problems in the ray tracing method: first, due to the problem of Boolean union, the three-dimensional information is reduced to one dimension, resulting in two problems, the operation of three-dimensional objects Should be normalized, the limited precision of machine calculations brings errors in the calculation of intersection points of lines and surfaces

Introducing a simple approximation regularization rule can ignore some small errors, but will have some side effects

Second, many commonly used intersection algorithms have some obvious numerical problems due to the limitations of floating-point arithmetic

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