Method for selecting X-ray detection parameters of GIS device

A technology for detecting parameters and X-rays, which is applied in the direction of using optical methods for testing, testing dielectric strength, and using radiation for material analysis. times, reducing the problem of parameter selection bias, and reducing the effect of X-ray radiation dose

Inactive Publication Date: 2017-10-24
STATE GRID CORP OF CHINA +2
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Problems solved by technology

However, the internal structure of GIS equipment is complex, and for high-voltage GIS equipment, the diameter of the tank will be much larger than 100mm, and the ray beam cannot be considered as parallel irradiation of GIS equipment, so the parameter selection method suitable for small-diameter tubes will be difficult to apply to GIS equipment X-ray inspection

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  • Method for selecting X-ray detection parameters of GIS device
  • Method for selecting X-ray detection parameters of GIS device
  • Method for selecting X-ray detection parameters of GIS device

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Embodiment Construction

[0042] Taking a specific GIS detection process as an example, a method for selecting the X-ray detection parameters of GIS equipment is described, and an X-ray machine with a focus size of 1 mm is used for experiments.

[0043] The detected GIS equipment is a 126kV arrester.

[0044] First, determine the basic parameters of the GIS equipment according to the relevant drawings and on-site measurements. Specifically, it includes the inner and outer diameters of the cylinder wall, material of the cylinder wall, internal structure type, material and corresponding dimensions. For the 126kV surge arrester in this example, its structural parameters are that the outer diameter of the cylinder wall is 680mm, the inner diameter is 660mm, the diameter of the central conductor is 70mm, and the material is aluminum alloy. The other parts have limited ability to attenuate X-rays, so their influence is ignored;

[0045] Next, determine the focal length. According to the formula in the meth...

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Abstract

The invention discloses a method for confirming X-ray detection parameters of a GIS device. The method comprises the following steps: 1) confirming focal length: collecting a focus size d of an X-ray machine and an outer wall with outer wall radius R of the GIS device and confirming the focal length F according to the focus size d of the X-ray machine and the outer wall with outer wall radius R of the GIS device; 2) confirming tube voltage: confirming the tube voltage used by the X-ray machine according to the structure and size of the GIS device; 3) confirming tube current: selecting the tube current corresponding to the tube voltage confirmed in the step 2) according to a characteristic curve of the tube voltage and the tube current of the X-ray machine; and 4) confirming exposure time: confirming the exposure time according to an exposure curve or the selected blackness and the tube voltage. According to the invention, the parameters required by the X-ray detection of the GIS device can be quickly selected, the problem of parameter selection deviation caused by experience-based judgment can be reduced and the detection efficiency and stability can be effectively increased.

Description

technical field [0001] The invention belongs to the field of electrical engineering, in particular to a method for selecting X-ray detection parameters of GIS equipment. Background technique [0002] SF 6 Gas insulated switchgear (GIS) is an important part of the power system. It has the advantages of high reliability, small footprint, and no interference from the external environment. It is widely used in ultra-high voltage and ultra-high voltage fields. The use of X-rays to detect faults in GIS equipment is a new detection method. In the actual maintenance process of GIS equipment, a series of faults such as metal particles and parts falling off can be effectively found, and there have been many successful application cases. [0003] However, the GIS equipment is a coaxial cylindrical structure, which belongs to the variable cross-section workpiece. For the directional X-ray machine, its transillumination thickness changes continuously and drastically in the effective tra...

Claims

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Application Information

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IPC IPC(8): G01N23/04G01R31/12
CPCG01N23/04G01R31/1218
Inventor 郭安祥王嘉琛丁卫东王亚楠李志闯刘一树周艺环吴子豪王辰曦
Owner STATE GRID CORP OF CHINA
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