A feature automatic recognition method for laser grooves formed by laser processing

A technology of laser processing and automatic identification, which is applied in image analysis, instruments, calculations, etc., can solve problems such as unsatisfactory measurement stability and repeatability, low detection accuracy of cutting instruments, and inaccurate test data, etc., to increase product quality Monitoring, reducing monitoring costs, and improving process effects

Active Publication Date: 2019-08-30
长川科技(苏州)有限公司
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Problems solved by technology

There are great shortcomings in the detection method of laser cutting instruments: on the one hand, the cutting instrument can only measure the width, but not the depth; There are some deviations caused by physical reactions (such as thermal effects, etc.), which make the test data inaccurate
But the measured laser groove width and depth must be found and determined artificially after measurement
Such a measurement operation greatly increases the measurement time. At the same time, due to manual search, the measured parameters are subject to the subjective influence of the operator, resulting in unsatisfactory stability and repeatability of the measurement.

Method used

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  • A feature automatic recognition method for laser grooves formed by laser processing
  • A feature automatic recognition method for laser grooves formed by laser processing
  • A feature automatic recognition method for laser grooves formed by laser processing

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Embodiment Construction

[0028] specific implementation plan

[0029] Below in conjunction with accompanying drawing, further illustrate the present invention, should be understood that these examples are only for illustrating the present invention and are not intended to limit the scope of a kind of feature automatic recognition method of the laser groove that laser processing forms of the present invention, after having read the present invention, Modifications to various equivalent forms of the present invention by those skilled in the art fall within the scope defined by the appended claims of the present application.

[0030] see figure 1 , is a structural diagram of the experimental device for laser groove recognition formed by laser processing in the present invention, which is mainly composed of a white light vertical scanning interference profiler and a computer. The white light vertical scanning interferometric profiler can obtain a digital image corresponding to the real height with a vert...

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Abstract

The invention proposes a method for automatically recognizing features of a laser groove formed by laser processing, and the method comprises the steps: employing a three-dimensional detection system to obtain a digital image corresponding to a real height, such as a white-light vertical scanning interference contourgraph, wherein the longitudinal resolution of the digital image is less than 1.0nm, and the highest lateral resolution can reach 0.35 microns, i.e., enabling each pixel to be corresponding to one height value. The digital image processing technology is employed for the recognition of the groove, and the width and depth of the groove are calculated. The above detection is carried out after the laser groove is formed by the laser processing, so the detection cannot be affected by the physical impact of laser processing, and the estimation accuracy and reliability of the laser groove can be improved.

Description

technical field [0001] The invention relates to the field of laser processing. Background technique [0002] Laser processing technology has been widely used in many fields of manufacturing. In recent years, with the further development of advanced manufacturing fields such as integrated circuit process technology and high-efficiency solar cell technology, the ability of micro-nano laser processing technology to display features in these fields has become an irreplaceable enabling technology in these fields. For example, in the manufacture of integrated circuits, the wafer itself is very thin, and the dicing process involves a series of problems, such as how many chips can be cut from a wafer, or how to cut complex integrated circuit chips without causing defects. As final chip products become smaller and smaller with more advanced features, the dicing process must work under increasingly stringent conditions. Due to the limitation of the size of the mechanical blade and t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/521G06T7/10G06T7/136G06T7/66
Inventor 夏勇孙焱群唐寿鸿
Owner 长川科技(苏州)有限公司
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