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Electron bombardment source and mass spectrometer

An electron bombardment and electron technology, applied in the field of mass spectrometry detection, can solve the problems of carrier gas accumulation, reduce the probability of sample ionization, limit the sensitivity of the instrument, etc., to reduce pressure, improve focusing effect and transmission efficiency, and reduce chemical noise interference. Effect

Pending Publication Date: 2017-10-27
GUANGZHOU HEXIN INSTR CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, in the traditional gas chromatography-mass spectrometry instrument, a large amount of carrier gas accumulates in the ionization chamber, which reduces the probability of the sample being ionized and limits the further improvement of the instrument sensitivity

Method used

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  • Electron bombardment source and mass spectrometer
  • Electron bombardment source and mass spectrometer
  • Electron bombardment source and mass spectrometer

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Embodiment Construction

[0028] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0029] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as...

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Abstract

The invention relates to an electron bombardment source and a mass spectrometer containing the same. The electron bombardment source comprises a housing, an ionization chamber, a repulsion electrode, a filament and an ion lens group; the ionization chamber is arranged inside the housing; the ionization chamber has a sample through hole, an electron through hole and a deflation hole; the electron bombardment source and the mass spectrometer containing the same can timely discharge carrier gas inside the ionization chamber through arrangement of the deflation hole on the ionization chamber. As a result, the electron bombardment source and the mass spectrometer can reduce pressure of an ion source, improves ionization efficiency and improves sensitivity of an instrument.

Description

technical field [0001] The invention relates to the field of mass spectrometry detection, in particular to an electron bombardment source and a mass spectrometer. Background technique [0002] Electron bombardment sources are one of the most commonly used ion sources for mass spectrometers. The electron bombardment source uses electrons in the mass spectrometer to bombard the sample to ionize it, and then conducts focusing modulation and sends it to the mass analysis instrument. The electron bombardment source has high sensitivity, can provide rich structural information, and has a standard spectral library that can be searched, so it is widely used in mass spectrometers, especially gas chromatography-mass spectrometry. However, in the traditional gas chromatography-mass spectrometer, a large amount of carrier gas accumulates in the ionization chamber, which reduces the probability of the sample being ionized and limits the further improvement of the sensitivity of the inst...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/14
CPCH01J49/147
Inventor 吴曼曼岑延相乔佳刘耀良张景堂谭国斌粘慧青
Owner GUANGZHOU HEXIN INSTR CO LTD
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