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Intelligent detection method for end face chipping of polycrystalline diamond compact

A polycrystalline diamond, intelligent detection technology, applied in the direction of optical testing flaws/defects, can solve the problems of low efficiency of end face chipping detection, strong subjectivity, inability to guarantee the accuracy and reliability of detection results, etc., and achieve enhanced chamfering. The effect of unifying with the chipping information and judgment criteria

Active Publication Date: 2019-10-18
福建省万龙新材料科技有限公司
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Problems solved by technology

[0005] The invention provides an intelligent detection method for end-face chipping of polycrystalline diamond composite sheets, which solves the problems of low detection efficiency, strong subjectivity, and inability to guarantee the accuracy and reliability of detection results, etc. And other issues

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  • Intelligent detection method for end face chipping of polycrystalline diamond compact
  • Intelligent detection method for end face chipping of polycrystalline diamond compact
  • Intelligent detection method for end face chipping of polycrystalline diamond compact

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Embodiment Construction

[0029] Specific embodiments of the present invention will be described below with reference to the accompanying drawings.

[0030] Such as figure 1 As shown, the PDC image acquisition device includes a camera 1, a lens 2, a light source 3, a mechanical motion platform (not shown in the figure) and the like. The camera 1 is fixed on a mechanical motion platform and is located directly above the PDC, a lens 2 is connected to the bottom, and a light source 3 is arranged between the lens 2 and the PDC. Most polycrystalline diamond compacts are cylindrical, and chipping defects generally appear on the edge of the chamfer of the polycrystalline diamond layer. In order to obtain images with more obvious features of chipping defects, the light source 3 adopts a zero-angle annular LED light source. The light emitted by the light source 3 is irradiated on the polycrystalline diamond composite sheet, and the light reflected by the chamfering and chipping defect areas enters the high-def...

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Abstract

An intelligent detection method for a corner chipping on the end surface of a polycrystalline diamond compact comprises the following steps: (1) adopting a PDC image acquisition device to acquire the image of the polycrystalline diamond compact; (2) pre-processing the image acquired in the step (1), wherein the pre-processing comprises threshold segmentation and median filtering, threshold segmentation is that binarization processing is performed on the image to improve the contract ratio of a target pixel in the image to an ambient background pixel, and median filtering is that noise and white spots in the image are removed to enable the edge of the corner chipping to become smooth; and (3) extracting defective features of the corner chippings, including circular positioning, arithmetic operation, defect identifying and marking. The problems that manual detection is low in efficiency, strong in subjectivity and not guaranteed in detection result accuracy and reliability are solved, and automatic, efficient and high-precision nondestructive detection with unified judgement standards are realized.

Description

technical field [0001] The invention relates to the technical field of diamond composite sheets, in particular to an intelligent detection method for end face chipping of polycrystalline diamond composite sheets. Background technique [0002] Polycrystalline diamond compact (PDC) is a superhard composite material, which is widely used in machining tools, petroleum and geological drill bits, grinding wheel dressing tools, etc. Its surface layer is polycrystalline diamond sintered from diamond powder, and the bottom layer is generally tungsten-cobalt cemented carbide. At present, the research on the quality inspection methods of polycrystalline diamond compacts mainly focuses on the performance inspection of wear resistance, thermal stability, impact toughness, and residual stress, and has made significant progress in improving the accuracy and efficiency of inspection results. [0003] However, for the detection of surface defects of polycrystalline diamond compacts, most do...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88
Inventor 黄莹祥何泽伟柳时栋杨志宏何克华陈琛李慧慧
Owner 福建省万龙新材料科技有限公司