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TVS (Transient Voltage Suppressor) with deep trench isolation structure and manufacturing method thereof

A technology of isolation structure and manufacturing method, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc., can solve the problem of transient voltage suppressor surge capacity reduction, unfavorable capacitive effect reducing device size, and leucorrhea effect. Breakthrough voltage drop and other problems, to achieve the effect of reduced size, high resistance to process fluctuations, and small footprint

Active Publication Date: 2017-11-21
傲威半导体无锡有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0019] In order to overcome the defects of large PN junction isolation leakage and capacitive effect that are not conducive to reducing the size of the device in the existing technology; at the same time, in order to overcome the LOCOS isolation loss active area, the surge capability of the transient voltage suppressor is reduced and the leucorrhea effect is caused. The problem of the drop in breakdown voltage and the problem of the transient voltage suppressor that the shallow trench STI isolation cannot penetrate the longitudinal structure, the present invention provides a TVS with a deep trench isolation structure and its manufacturing method

Method used

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  • TVS (Transient Voltage Suppressor) with deep trench isolation structure and manufacturing method thereof
  • TVS (Transient Voltage Suppressor) with deep trench isolation structure and manufacturing method thereof
  • TVS (Transient Voltage Suppressor) with deep trench isolation structure and manufacturing method thereof

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Embodiment Construction

[0048] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further elaborated below in conjunction with illustrations and specific embodiments.

[0049] like figure 1 , 2 As shown in and 3, the TVS with deep trench isolation structure of the present invention includes a substrate 1 and an epitaxial layer 2 opposite to the type of the substrate. The epitaxial layer has a doped layer 3 of the same type as the substrate, and the periphery of the TVS is provided with The annular deep groove 4 is filled with an insulating medium, and a contact hole 501 is opened on the doped layer inside the deep groove, and a metal is drawn out to make the first electrode 5. The doped layer is covered with an interlayer dielectric 6 to connect the first electrode with the deep Groove isolation, a passivation layer 7 is provided on the first electrode, and a hole for the first electrode is op...

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Abstract

The invention provides a TVS (Transient Voltage Suppressor) with a deep trench isolation structure, which comprises a substrate and an epitaxial layer with the type being opposite to that of the substrate, and is characterized in that the epitaxial layer is provided with a doping layer with the type being the same as that of the substrate, the periphery of the TVS is provided with an annular deep trench, the deep trench is filled with an insulation medium, the doping layer at the inner side of the deep trench is provided with a contact hole, metal is led out to act as a first electrode, the doping layer is covered with an interlayer dielectric to isolate the first electrode and the deep trench, the first electrode is provided with a passivation layer, and the passivation layer is provided with a hole used for leading out the first electrode; metal is led out from the back of the substrate to act as a second electrode; and the deep trench runs through the doping layer and the epitaxial layer and extends to the substrate. According to the invention, side isolation of a PN junction is realized, and the PN junction is filled with an insulating material so as to reduce side electric leakage of the PN junction; the mode of deep trench isolation is adopted, the occupied area is small, and the size of a chip can be significantly reduced; and the epitaxial thickness is small, a rebound is achieved in reverse conduction, the avalanche breakdown electric leakage is smaller than an ordinary PN junction, and the conduction is faster.

Description

technical field [0001] The invention relates to a semiconductor device, in particular to a TVS with a deep trench isolation structure and a manufacturing method thereof. Background technique [0002] With the continuous development of the market, TVS (Transient Voltage Suppressor, Transient Voltage Suppressor) has gradually developed into a circuit structure composed of individual independent devices (such as diodes, transistors, etc.) connected through specific electrical pathways, so in its manufacturing It must be possible to isolate individual individual devices which can then be interconnected to form the specific circuit structure required. Poor isolation will cause problems such as leakage and low breakdown. Therefore, isolation technology is a key technology in the production of TVS. [0003] The existing isolation process technologies are as follows: [0004] 1. PN junction isolation [0005] Generally, it is realized by diffusing on the N-type epitaxial layer o...

Claims

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Application Information

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IPC IPC(8): H01L27/02H01L21/762
CPCH01L21/76224H01L27/0203H01L27/0248
Inventor 吴昊陆亚斌
Owner 傲威半导体无锡有限公司
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