Unlock instant, AI-driven research and patent intelligence for your innovation.

Test Platform and Method for Weak Spectral Signal of Infrared Focal Plane Detector

An infrared focal plane and detector technology, applied in the direction of electric radiation detectors, etc., can solve problems such as cumbersome operation, noise influence, and complex system, and achieve the effect of simple system, high accuracy, and simple test process

Active Publication Date: 2019-12-10
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, with the increase of the wavelength, the signal-to-noise ratio of the spectral response signal of the infrared focal plane detector to the mid-infrared, far-infrared, and extreme far-infrared bands is low, and the spectral response obtained by the traditional DC method will be greatly affected by noise, which is difficult Accurately extract the spectral response signal
However, the method of adding a sample-and-hold circuit to obtain the response voltage of the infrared focal plane detector through a lock-in amplifier has the disadvantages of complex system and cumbersome operation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test Platform and Method for Weak Spectral Signal of Infrared Focal Plane Detector
  • Test Platform and Method for Weak Spectral Signal of Infrared Focal Plane Detector
  • Test Platform and Method for Weak Spectral Signal of Infrared Focal Plane Detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] Such as figure 1As shown, a test platform for a weak spectral signal of an infrared focal plane detector includes an infrared light source 11 for providing broad-spectrum infrared radiation, and a chopper 12 for modulating a signal is sequentially arranged along the emitting direction of the infrared light source. A monochromator 13 and an acquisition module 15 for splitting light from a wide-spectrum infrared radiation source, the exit port of the monochromator 13 is fixed with an optical filter 14 for eliminating the influence of binary diffraction, and the acquisition module 15 is aligned with the exit port of the monochromator 13 , the upper computer control system 16 is respectively connected with the infrared light source 11, the chopper 12, the monochromator 13, and the acquisition module 15; the infrared light source 11 is a chamber black body; the upper computer control system 16 is used to control the infrared light source temperature, chopping frequency, mono...

Embodiment 2

[0034] This embodiment provides a method for extracting the weak spectral signal of the infrared focal plane detector using the platform in Embodiment 1. The method utilizes a chopper to modulate the signal of the infrared radiation source to a fixed frequency, and then uses the fast Fourier transform in the The spectral response signal of the infrared focal plane detector to be tested is obtained in the frequency domain.

Embodiment 3

[0036] Such as figure 2 As shown, the present embodiment provides a method for extracting a weak spectral signal using the infrared focal plane detector of the platform in Embodiment 1, and the extraction method includes the following steps:

[0037] Step (a): Select the test pixel area of ​​the detector under test: the selected test pixel area of ​​the detector under test is the area covered by the exit light slit of the monochromator and does not contain blind cells;

[0038] Step (b): Obtain the time-domain signal V of the detector under test at each wavelength point t (λ);

[0039] Step (c): Restore the spectral response signal V of the measured detector at each wavelength point f (λ).

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a test platform for weak spectral signals of infrared focal plane detectors, a method for extracting weak spectral signals of infrared focal plane detectors using the test platform, and a method for obtaining relative spectral responses of infrared focal plane detectors. The platform includes an infrared focal plane detector. Light source, chopper, monochromator, acquisition module, optical filter, upper computer control system, the acquisition module includes standard detector, lock-in amplifier, tested detector, and test adapter board; the extraction method uses a chopper The infrared radiation light source signal is modulated to a fixed frequency, and then the spectral response signal of the measured infrared focal plane detector is obtained in the frequency domain through fast Fourier transform; the invention can detect the mid-infrared, far-infrared, Accurately extract spectral signals when the signal-to-noise ratio is extremely low in the extreme far-infrared band test. The test adapter board does not require additional directional design, the system is simple, the test process is simple, and the accuracy is high.

Description

technical field [0001] The invention relates to the technical field of infrared focal plane detectors, in particular to a test platform for weak spectral signals of infrared focal plane detectors, a method for extracting weak spectral signals of infrared focal plane detectors using the test platform, and obtaining infrared focal plane detection method for the relative spectral response of the detector. Background technique [0002] The infrared focal plane detector is the third generation infrared detector. Because of its performance as a large area array, canceling the optical-mechanical scanning structure, high detector sensitivity, small size, and light weight, it is widely used in various fields such as military, industrial, and environmental monitoring. The relative spectral response of infrared focal plane detectors, that is, the change of responsivity with the wavelength of infrared radiation is an important index of infrared detectors. The higher the spectral respo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/12
CPCG01J5/12
Inventor 刘子骥熊兴李成世张洪波余段辉范益红蒋亚东
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA