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Any combination of multi-element simultaneous measurement and combined measurement system

A measurement system, multi-element technology, applied in general control systems, control/regulation systems, program control, etc., can solve problems such as user inconvenience, inability to measure multiple elements at the same time, and limit users, and achieve the effect of improving work efficiency

Active Publication Date: 2019-05-17
BEIJING HAIGUANG INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, some similar products on the market are designed with multi-element lamp positions, but they cannot realize simultaneous measurement of multiple elements; some can only perform simultaneous measurement of specified element channels, which brings inconvenience to users;
[0003] In addition, almost all similar products on the market do not have the function of combining channels, and the only ones are only combined measurement of fixed channels, which is also limited to the combination of two channels, which not only limits users, but also does not make full use of the multi-channel instruments. Function
[0004] If similar products on the market want to improve the test sensitivity, they can only change the working conditions (such as increasing the negative high voltage), but the noise also increases; the other is to concentrate the sample, which brings a workload to the operator and introduces Measurement error

Method used

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  • Any combination of multi-element simultaneous measurement and combined measurement system
  • Any combination of multi-element simultaneous measurement and combined measurement system
  • Any combination of multi-element simultaneous measurement and combined measurement system

Examples

Experimental program
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Effect test

Embodiment 1

[0040] see figure 1 , this embodiment arbitrarily combines multi-element simultaneous measurement and combined measurement system, single measurement mode, this example takes 3-element simultaneous measurement as an example. The instrument is equipped with 3 different element lamps, A-C lamps, and the 3 element lamps can correspond to 3 independent signal acquisition channels, so that the channels can be matched arbitrarily.

[0041] The measurement mode is divided into single-channel, dual-channel, 3-channel, and 4-channel simultaneous measurement modes. To make any combination of different light positions, the user only needs to select 3 elements to measure together on the software.

[0042] In this embodiment, taking the simultaneous measurement of 3 elements as an example, the element lights can be installed at any position, and the operator selects the positions of the 3 element lights that need to be measured at the same time among the 4 element lights. Assuming that A,...

Embodiment 2

[0044] see figure 2, this embodiment arbitrarily combines multi-element simultaneous measurement and combined measurement system, single measurement mode, and this embodiment takes 4-channel combination as an example. The instrument is equipped with 4 identical element lamps. The user selects 4-channel combined measurement on the operating software, and the computer sends the 4-channel combined mode to the timing generator through the single-chip unit, and the timing controller sends 4 channels to the selected element lamp control unit in time. Lighting pulses with different timing sequences respectively excite the spectral signals of the same measured element respectively. The spectral signals of the same measured element are detected by 4 signal channels respectively, and connected to the multi-channel analog switch respectively. The analog switch is controlled by the timing generator, and the 4 signals are connected to the sampling control and the A / D converter in sequenc...

Embodiment 3

[0046] see image 3 , this embodiment arbitrarily combines multi-element simultaneous measurement and combined measurement systems and combined measurement modes.

[0047] Install 4 identical element lamps on the A-D position, the user selects 4 lamp single-channel combined measurement on the operating software, and the computer sends this measurement mode to the timing generator through the single-chip unit, and the timing controller controls the selected element lamps. The unit sends out 4 lighting pulses with the same time sequence at the same time, which is equivalent to 4 element lamps simultaneously exciting the spectral signals of the measured elements, that is, the signal intensity of the signal channel is increased by 4 times. The multi-channel analog switch is controlled by the timing generator, fixedly connects the signal of the first signal channel to the sampling control and A / D converter, converts the analog voltage into digital quantity, and sends it to the comp...

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Abstract

The invention relates to an arbitrary combination multi-element simultaneous measurement and merged measurement system and aims to improve test work efficiency and measurement sensitivity. The arbitrary combination multi-element simultaneous measurement and merged measurement system comprises four element lamps and a power supply circuit, wherein each element lamp respectively corresponds to four signal channels used for carrying out amplification and integration of signals, each signal channel is connected with one multi-path simulation switch, then connection with sampling control and an A / D conversion circuit is carried out, a simulation voltage signal acquired through measurement is converted by the A / D conversion circuit into data quantity, the data quantity is transmitted by a single-chip microcomputer through an RS232 interface to a computer, the single-chip microcomputer is further used for outputting various control instructions, the computer connected with the single-chip microcomputer is further used for carrying out operation and data processing, and a sequential generator is used for carrying out control on each element lamp, the multi-path simulation switches, the sampling control and an A / D converter according to the instructions of the single-chip microcomputer. The system is advantaged in that simultaneous measurement of different elements of the arbitrary-lamp position can be realized, merged measurement of arbitrary channels of a single element can be further realized, and single-channel measurement of simultaneously-excited arbitrary lamp combinations can be further realized.

Description

technical field [0001] The invention specifically relates to an arbitrary combination multi-element simultaneous measurement and combined measurement system. Background technique [0002] At present, some similar products on the market are designed with multi-element lamp positions, but they cannot realize simultaneous measurement of multiple elements; some can only perform simultaneous measurement of specified element channels, which brings inconvenience to users; [0003] In addition, almost all similar products on the market do not have the function of combining channels, and the only ones are only combined measurement of fixed channels, which is also limited to the combination of two channels, which not only limits users, but also does not make full use of the multi-channel instruments. Function. [0004] If similar products on the market want to improve the test sensitivity, they can only change the working conditions (such as increasing the negative high voltage), but...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/042
CPCG05B19/0423G05B2219/25257
Inventor 李明章刘海涛闫京山李金虎林建奇李崇江宫博
Owner BEIJING HAIGUANG INSTR
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