Method for determining rationality of thermal cycling test condition cutting of spacecraft electronic equipment

Abstract

The invention discloses a thermal cycling test condition cutting method suitable for different spacecraft electronic equipment. Based on the statistical law of historical fault distribution and thermal fatigue faults of a subsystem and a single-machine stage of an spacecraft, a comprehensive fatigue acceleration index is obtained by using a re-weighting method, and determining criteria and acquisition methods of underlying model parameters of the spacecraft are also provided. According to the thermal cycling test condition cutting method disclosed by the invention, the problem that a thermalcycling test condition cutting formula in MIL-STD-1540B and GJB 1027-2005 'Test Requirements for Launch Vehicles, Upper Stages and Spacecrafts' cannot cover the fault types of all types of the spacecrafts and all types of the subsystems can be solved, and the cost of the spacecrafts can be controlled on the basis of avoiding over-tests and under-tests.

Description

technical field [0001] The invention belongs to the technical field of thermal testing of spacecraft. Specifically, the present invention relates to a comprehensive tailoring method for thermal cycle test conditions of spacecraft, which is suitable for different spacecraft subsystems and thermal cycle test temperatures and cycles of different types of electronic component failures. Clipping of times condition. Background technique [0002] The thermal cycle test of spacecraft electronic equipment is an important link in the quality assurance of spacecraft hardware. As an easy-to-implement and efficient method, it has been widely used in the reliability and performance verification tests of various spacecraft. [0003] Generally speaking, at various stages of the spacecraft, such as stand-alone level, sub-system and system level thermal cycles, testing electronic equipment requires a large number of high and low temperature cycles in ground tests, so it is necessary to determ...

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Problems solved by technology

[0005] The purpose of the present invention is to provide a tailoring method for the thermal cycle test conditions of a spacecraft electronic stand-alone, to determine reasonable thermal cycle test conditions, and solve the problem that the thermal cycle test condition tailoring formula in the MIL1540 standard and GB1027 cannot cover all types of spacecraft failure types And all types of subsystems, resulting in the problem of under-testing or over-testing of part of the spacecraft

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