A test method for detection circuit of atomic fluorescence spectrometer

Abstract

The invention discloses a test method of an atomic fluorescence spectrometer detection circuit, the test method is characterized in that a signal generator is acquired, the signal generator includes acurrent signal source and a voltage signal source; the test method includes testing of a presignal forming module and testing of a signal acquisition module; during testing of the presignal forming module, the output of the current signal source is used as the input of the presignal forming module; during testing of the signal acquisition module, the output of the voltage signal source is used asthe input of the signal acquisition module; an oscilloscope is used to observe whether the presignal forming module is normal, and whether the output of the signal acquisition module is normal can betested by instrument display of itself. Multi characteristic signals generated in the using process of an atomic fluorescence spectrometer can be simulated without consumption of samples and reagents, the analysis cost is greatly reduced, the testing efficiency of the circuit is improved, and the test method is time-saving and labor-saving; the output signal amplitude is adjustable and stable, the consistency of same circuit module in the instrument can be ensured, and product quality can be ensured.

Description

technical field [0001] The invention relates to the field of hardware circuit testing methods in the development and production process of atomic fluorescence spectrometers, in particular to a testing method for detection circuits of atomic fluorescence spectrometers, which is used to test whether the detection circuit part, one of the cores of atomic fluorescence spectrometers, works normally. Background technique [0002] After the gaseous free atoms absorb the characteristic radiation of the light source, the outer electrons of the atoms transition to a higher energy level, and then transition back to the ground state or a lower energy level, and at the same time emit light with the same or different wavelength as the original excitation, which is atomic fluorescence. Atomic fluorescence analysis (AFS) is a method to determine the content of the analyte element by measuring the fluorescence emission intensity generated by the atomic vapor of the analyte element under the e...

AI Technical Summary

Problems solved by technology

Therefore, the existing testing method of the detection circuit of the atomic fluorescence spectrometer has many shortcomings such as cumbersome operation, large consumption of samples and chemical reagents, high analysis cost, time-consuming and laborious, etc.

In addition, the detection method using the detection circuit of the above-mentioned existing atomic fluorescence spectrometer will also appear due to slight differences in the same sample (the detection accuracy of the atomic fluorescence spectrometer is very high, and the slight deviation of the sample will also affect the measurement results). The instability of the signal makes it difficult to achieve the consistency of the detection circuits in mass-produced multiple atomic fluorescence spectrometers

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