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Optical field microimaging-based micro-scale three dimensional industrial detection system

A light field microscope and detection system technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as high cost, poor applicability, limited instruments and methods on the surface characteristics of objects, and reduce measurement errors , cost reduction, and simple installation

Inactive Publication Date: 2018-02-16
广州首感光电科技有限公司
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  • Abstract
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AI Technical Summary

Problems solved by technology

3D inspection does not rely on a single technology. Various reconstruction techniques have their advantages and disadvantages. Currently, there is no general reconstruction technique. Instruments and methods are often limited by the surface characteristics of objects.
Although the multi-eye stereo vision system has a relatively low cost, its accuracy and requirements for shooting conditions are high, and its applicability is not strong. It needs a larger shooting window to arrange the camera, and it is more difficult to arrange the measurement window for micro-scale objects.
3D laser scanning technology can quickly and massively collect spatial point information, but there are disadvantages such as generally high cost, contradictions in accuracy, ranging and scanning speed, not suitable for precise surfaces, and unable to meet the needs of small micro-scale objects. Measurement window requirements

Method used

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  • Optical field microimaging-based micro-scale three dimensional industrial detection system
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  • Optical field microimaging-based micro-scale three dimensional industrial detection system

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Embodiment Construction

[0016] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0017] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "left" and "right" are based on the orientation and positional relationship shown in the drawings, and are only for the convenience of describing the present invention. structure and mode of operation, rather than indicating or implying that the referred part must have a particular orientation or operate in a particular orientation, and thus should not be construed as limiting the invention.

[0018] figure 1 Shown is a schematic diagram of the actual detection work of the present inv...

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Abstract

An optical field microimaging-based micro-scale three dimensional industrial detection system belonging to the machine vision technology field disclosed by the present invention comprises an optical field microcamera system and a data processing system, the optical field microcamera system is composed of an optical field microcamera, an annular light source and a camera calibration plate, and thedata processing system comprises a GPU high-speed image parallel processing unit, an optical field camera-based depth estimation algorithm and an optical filed microscope-based three-dimensional reconstruction algorithm. An optical field imaging technology of the present invention can measure the three-dimensional configurations of the complex objects via a single device and the individual shooting, is very suitable for substituting for a conventional industrial detection camera in the micro-scale measurement, and measures the three-dimensional sizes of the micro-scale objects while simplifying a hardware system and reducing the cost.

Description

technical field [0001] The invention relates to the fields of microscopic imaging and machine vision, in particular to a microscale three-dimensional industrial detection system with a microlens array based on light field microscopic imaging. Background technique [0002] In the field of industrial inspection in industrial manufacturing, machine vision technology is often used to solve problems. In industrial inspection, for micro-scale objects, various types of three-dimensional inspection technologies are usually used to inspect products. Three-dimensional inspection does not rely on a single technology. Various reconstruction techniques have their advantages and disadvantages. Currently, there is no general reconstruction technique, and instruments and methods are often limited by the surface characteristics of objects. For example, optical techniques are not easy to handle shiny (high albedo), mirror or translucent surfaces, while laser techniques are not suitable for f...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/22G01B11/24
CPCG01B11/22G01B11/24
Inventor 曹后平刘曙光赵洲
Owner 广州首感光电科技有限公司
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