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4 results about "Light field microscopy" patented technology

Light field microscopy (LFM) is a scanning-free 3-dimensional (3D) microscopic imaging method based on the theory of light field. This technique allows sub-second (~10 Hz) large volumetric imaging ([~0.1 to 1 mm] 3) with ~1 μm spatial resolution in the condition of weak scattering and semi-transparence,...

A light field microscopic imaging system based on rare earth upconversion materials

PendingCN122282712AMicro imagingFirst light
This invention provides a light field microscopy imaging system based on rare-earth upconversion materials, comprising: a first light source, a second light source, a third light source, a spatial filtering module, a first dichroic mirror, a second dichroic mirror, a third dichroic mirror, an aperture, a multi-channel filtering module, an objective lens, a tube lens, a microlens array, and a sensor. Light of different wavelengths emitted from the first, second, and third light sources is transmitted through the spatial filtering module to the corresponding first, second, and third dichroic mirrors. The first, second, and third dichroic mirrors are spatially aligned and beam-combined through the aperture. The combined three-color light sources are focused into the objective lens to achieve wide-field illumination. The rare-earth upconversion material-labeled sample is excited and transmitted through the multi-channel filtering module to the tube lens to form an image. The microlens array is located at the focal point of the tube lens, and the sensor is located at the focal length of the microlens array for recording the three-color imaging of the sample.
Owner:TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL

Method and device for microscopy

A method including the following: a) a light field microscope records at least one image of a sample, said image consisting of a set of partial images, b) at least one aberration of the imaging system of the light field microscope is specified by a user and / or established from a set of partial images recorded in step a), c) one or both of steps d) and e) are performed using the aberrations of the imaging system specified and / or established in step b): d) reconstructing a three-dimensional image of the sample from the set of partial images, wherein the aberrations of the imaging system which are specified and / or established in step b) are at least partially corrected; e) establishing improved settings of adjustable components of the imaging system which influence wavefronts of the propagated light, on the basis of the aberrations specified and / or established in step b). The invention also relates to a microscopy apparatus.
Owner:CARL ZEISS MICROSCOPY GMBH

A Self-Supervised Learning-Based Method and System for Joint Reconstruction and Denoising of Light Field Microscopy

This invention relates to the field of computational optical imaging and microscopic image processing technology, and discloses a method and system for joint reconstruction and denoising of light field microscopy based on self-supervised learning. In the pre-training stage, the method performs random masking operations in the spatial and angular domains on large-scale light field data, guiding the encoder to learn general features through a completion task. In the model training stage, the acquired light field images are randomly divided into input and supervision viewpoints. Features are extracted using the encoder and aligned in three-dimensional space using a physical point spread function. A three-dimensional volume is generated through viewpoint pooling and a decoding network, and a self-supervised loss is established using the supervision viewpoint, achieving implicit denoising based on the independence of noise distribution between viewpoints. In the testing stage, high signal-to-noise ratio three-dimensional reconstruction results can be obtained by inputting all viewpoints. This invention does not rely on noise-free ground truth images, can adapt to different optical system configurations, and improves the reconstruction quality and denoising capability of light field microscopy imaging.
Owner:TSINGHUA UNIVERSITY

A snapshot light field microscope with large depth of field and a preparation method thereof

ActiveCN119472002BImage calibrationFemto second laser
The application discloses a snapshot type light field microscope with large depth of field and a preparation method thereof, and belongs to the technical field of photoelectric devices and microscopic imaging, and comprises the following steps: design of a large-depth curved micro-lens array; femtosecond laser direct writing preparation of the curved micro-lens array; assembly and integration of the curved micro-lens array; preparation and image calibration of the snapshot type light field microscope; the method of the application is to replace the plane configuration with the curved micro-lens array to enhance the parallax, and replace the conventional spherical lens with a specially designed lens surface to expand the depth of focus, thus fundamentally solving the baseline limitation problem of the conventional plane micro-lens array, greatly improving the imaging depth of field and depth perception ability of the optical microscope, and retaining the imaging resolution at the level of the diffraction limit. The high-precision preparation of the special function surface curved micro-lens array can be realized by using the femtosecond laser additive manufacturing technology, and the prepared curved micro-lens array is integrated with a commercial objective through a customized mechanical adapter, so that the preparation of the snapshot type light field microscope with large depth of field is finally realized.
Owner:JILIN UNIVERSITY