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Nanosecond electromagnetic pulser used for electromagnetic fault injection

An electromagnetic pulse and fault injection technology, which is applied in the fields of instruments, electrical digital data processing, CAD circuit design, etc. It can solve the problems of difficulty in adjusting amplitude and pulse width, limitation of service life and frequency, and bulky experimental equipment. The effect of long service life, high repetition frequency and high stability of circuit operation

Pending Publication Date: 2018-03-20
TIANJIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the electromagnetic pulse generator developed at present produces high pulse amplitude and short rise time, the control circuit is complicated, the experimental device is bulky, and because the spark gap is used as a switch, its service life and frequency are greatly limited. , the adjustment of amplitude and pulse width is also very difficult

Method used

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  • Nanosecond electromagnetic pulser used for electromagnetic fault injection
  • Nanosecond electromagnetic pulser used for electromagnetic fault injection
  • Nanosecond electromagnetic pulser used for electromagnetic fault injection

Examples

Experimental program
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Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with specific embodiments.

[0022] like figure 1 Shown is the functional block diagram of the electromagnetic pulse generator, including: DC power supply, signal generator, Marx generator, MOSFET drive circuit and electromagnetic probe. The DC power supply supplies power to the Marx generator and the MOSFET drive circuit respectively, and the signal generator provides pulse signals for the MOSFET drive circuit to control the on and off of the MOSFET switch, and then generates an instantaneous pulse width and frequency on the electromagnetic probe with the set value. state electromagnetic pulse.

[0023] like figure 2 Shown is a schematic diagram of the circuit design structure of the MOSFET driving circuit. The driving resistor Rg is connected in series between the driving chip and the gate of the MOSFET, and the appropriate value is selected to reduce the oscillation amplitude of the dr...

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PUM

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Abstract

The invention discloses a nanosecond electromagnetic pulser used for electromagnetic fault injection, and belongs to the field of electromagnetic fault injection, and the nanosecond electromagnetic pulser is used for generating transient electromagnetic pulse signals. The nanosecond electromagnetic pulser mainly comprises a direct-current power source, a signal generator, an Marx generator, an MOSFET driving circuit and an electromagnetic probe. The direct-current power source supplies power to the Marx generator and the MOSFET driving circuit, the signal generator provides pulse signals for the MOSFET driving circuit, controls on-off of MOSFET, and then the transient electromagnetic pulse with pulse width and frequency being set values is generated on the electromagnetic probe. Voltage pulse signals with adjustable amplitude and variable pulse width (200-2000 ns) can be generated at the two ends of the electromagnetic probe at the load end, and then transient electromagnetic pulse with the pulse width and frequency being set values is generated on the electromagnetic probe. The nanosecond electromagnetic pulser is simple in design principle, low in manufacturing cost and high in circuit stability.

Description

technical field [0001] The invention relates to the field of electromagnetic pulse fault injection, in particular to a nanosecond electromagnetic pulse generator for electromagnetic fault injection. Background technique [0002] With the continuous shrinking of the feature size of CMOS technology, the electromagnetic compatibility of integrated circuits has received more and more attention and research. Electromagnetic Fault Injection (EMFI) refers to the use of local strong magnetic fields generated by electromagnetic probes to attack chips, resulting in transient induced voltages and currents inside the chips, and introducing faults to the attacked chips. Electromagnetic fault injection is a new attack method, which can attack part of the chip and use cryptanalysis technology to obtain its confidential information, which is widely used. In order to develop effective protection measures, it is necessary to study the fault mechanism of electromagnetic pulse fault injection ...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/30
Inventor 袁果刘强
Owner TIANJIN UNIV
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