Method and device for diagnosing bundle length

A diagnostic method and beam cluster technology, which are applied in nuclear science and fields, can solve the problems of difficult separation of cylindrical deflection cavity modes, complicated design and analysis of asymmetric structural cavity, etc. The effect of compact structure

Active Publication Date: 2019-04-12
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0004] In view of the above defects or improvement needs of the prior art, the present invention provides a bunch length diagnostic method and device, thereby solving the difficulty in separating the modes of the cylindrical deflection cavity in the current ultrafast electron beam detection and the need for a specially designed asymmetric structure And cavity design analysis complex technical issues

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  • Method and device for diagnosing bundle length
  • Method and device for diagnosing bundle length

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0024] The invention discloses a method for diagnosing beam cluster length, which can simplify cavity design and beam dynamic analysis difficulty, and the method includes:

[0025] TM generated using a rectangular single deflection cavity 120 Die or TE 102 The mode applies transverse (horizontal or vertical) deflection force to the electron beam passing through the rectangular single deflectio...

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Abstract

The invention discloses a beam bunch length diagnosis method and device. At present, a subpicosecond-level electron beam widely adopts a cylindrical or multi-cavity structure. By contrast, the beam bunch length diagnosis method provided by the invention adopts a rectangular single-deflection cavity to work in a TM120 mode or TE102 mode, and a vertical direction deflection effect is generated on anelectron beam through a horizontal magnetic field on a central axis. Due to nonaxisymmetry of a cross section of a cavity, mode separation can be naturally realized while a length-width ratio is guaranteed not to be 1, and an asymmetric structure does not need to be additionally introduced, so that a cavity design process is greatly simplified. Resonant frequency in a single-cavity TM120 mode orTE102 mode has nothing to do with the longitudinal size of the cavity, a pi phase shift mode under a multi-cavity structure can be abandoned, and optimization can be performed aiming at a transverse size and a longitudinal size separately, thereby obtaining a relatively compact structure. The beam bunch length diagnosis method and device go through three-dimensional electromagnetic calculation andbeam tracking verification, are novel in concept and reliable in design, and are of great significance to diagnosis of an ultrafast electron beam represented by free electron laser application.

Description

technical field [0001] The invention belongs to the field of nuclear science and technology, and more specifically relates to a method and device for diagnosing bundle length. Background technique [0002] In recent years, accelerator-based light source devices, such as free electron lasers and synchrotron radiation light sources, have been widely used in life sciences and materials science because of their excellent performance that traditional light sources cannot match, such as ultra-high brightness, ultra-short pulse, and strong coherence. A great success has been achieved in the field of atomic and molecular dynamic detection. Correspondingly, with the application of photocathode electron guns and magnetic compression systems, the length of the electron beams produced by the accelerator has been shortened from the initial nanosecond level to the picosecond or even femtosecond level, which brings great advantages to the measurement of the longitudinal distribution of the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/04
CPCG01B7/046
Inventor 陈曲珊秦斌冯光耀熊永前樊宽军陈炜白金
Owner HUAZHONG UNIV OF SCI & TECH
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