Trench MOS device with integrated TMBS structure and manufacturing method thereof

A MOS device and trench technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of occupying chip area and cost, high manufacturing cost, extra loss, etc., to suppress peak voltage and peak current. , the effect of saving silicon surface area and reducing switching loss

Pending Publication Date: 2018-03-30
华羿微电子股份有限公司
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage is that the cost is high, it takes up more area of ​​the circuit board, and due to the influence of parasitic inductance introduced by the long trace, it brings additional loss and EMC and EMI problems
[0005] The second stage is to package the independent Schottky chip and the independent trench MOSFET chip in parallel in the same semiconductor device package. The trench MOSFET chip and the Schottky chip are connected in parallel by wire bonding. The disadvantage is still high cost and High requirements on packaging and large overall area after packaging
[0006] The third stage is to design and manufacture trench MOSFETs and Schottky diodes in the same chip. The method of processing trench MOSFETs and Schottky diodes is to use partition design and differentiated manufacturing schemes, and realize through wire bonding. Interconnection still occupies a large amount of chip area and cost
[0007] Therefore, the disadvantages are: 1. The Schottky diode structure occupies a large amount of silicon surface area, resulting in large chip area and high cost; 2. The process is complicated, resulting in high manufacturing cost.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Trench MOS device with integrated TMBS structure and manufacturing method thereof
  • Trench MOS device with integrated TMBS structure and manufacturing method thereof
  • Trench MOS device with integrated TMBS structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0046] An embodiment of the present invention provides a trench MOS device with an integrated TMBS structure, such as figure 1 As shown, it includes a drain region of the first conductivity type, an N+ monocrystalline silicon substrate located above the drain region of the first conductivity type, an N- epitaxial layer, and a P-type well region located above the N- epitaxial layer layer, an N+ source region layer positioned above the P-type well region layer, an insulating dielectric layer positioned above the N+ source region layer, and a metal region layer positioned above the insulating dielectr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of semiconductor power devices, and in particular relates to a trench MOS device with an integrated TMBS structure and a manufacturing method thereof. In the invention, the TMBS diode is located between two trench MOSFET unit cells, which effectively and greatly reduces the Switching loss, suppressing peak voltage and peak current, effectively saving the silicon surface area, reducing the cost of the device, due to the introduction of the TMBS diode structure, can greatly reduce the leakage current of the device and improve the safety performance of the device during use.

Description

technical field [0001] The invention belongs to the technical field of semiconductor device manufacturing, and in particular relates to a trench MOS device with an integrated TMBS structure and a manufacturing method thereof. Background technique [0002] With the continuous and rapid development of my country's economy, energy consumption is also increasing year by year, especially in the context of global warming, "low-carbon economy" has gradually become a global hotspot, so energy conservation has become one of my country's basic national policies; and New power electronic devices play a particularly important role in it. Among them, trench MOS devices are semiconductor devices with rapid development and good market prospects. They have fast switching speed, high input impedance, good thermal stability, and strong reliability. Advantages, it has a wide range of applications in the fields of computers, communication equipment, power supply circuits of general office equipme...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/78H01L29/872H01L21/336
CPCH01L29/7806H01L29/66734H01L29/7813H01L29/8725
Inventor 袁力鹏徐吉程宁波
Owner 华羿微电子股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products