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A method and system for increasing the operating temperature range of SSDs

A technology of working temperature and range, applied in the direction of response error generation, redundant code error detection, instrument, etc., can solve the problems of reduced working stability of SSD and large temperature influence, so as to improve the overall working temperature, reduce the number of times, Effect of reducing performance-perceived impact

Active Publication Date: 2021-09-17
HUNAN GOKE MICROELECTRONICS
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Problems solved by technology

[0007] This application provides a method and system for increasing the operating temperature range of SSDs to solve the problem that the read and write of NANDFLASH data in SSDs is greatly affected by temperature, so that SSDs can only work at a fixed operating temperature, thereby reducing the working stability of SSDs. The problem

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  • A method and system for increasing the operating temperature range of SSDs
  • A method and system for increasing the operating temperature range of SSDs
  • A method and system for increasing the operating temperature range of SSDs

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Embodiment Construction

[0058] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings.

[0059] see figure 1 , which is a flow chart of a method for increasing the operating temperature range of an SSD provided in an embodiment of the present application, including:

[0060] Step 101, obtain the data to be written and the working environment temperature of the SSD; the data to be written is generally sent to the SSD by the upper host of the SSD peripheral, and the working environment temperature of the SSD is measured by a temperature sensor inside the SSD.

[0061] Step 102, write the data to be written into the NAND FLASH of the SSD; the preset temperature range in this application refers to the operating temperature range of the NAND FLASH declared in the NAND FLASH chip manua...

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Abstract

This application discloses a method and system for increasing the working temperature range of SSD. First, the data to be written and the working environment temperature of SSD are obtained, and then the working environment temperature of SSD is compared with the preset temperature range. The written data is written into the NAND FLASH of the SSD, the data stored in the NAND FLASH is read, and finally the data is corrected for data errors, and an appropriate data rereading strategy is selected to perform data rereading operations on the data whose error correction has not been successful. Reduce the number of data error corrections. The method and system in the embodiment of the present application can more accurately predict the influence of temperature on the threshold voltage of the NAND FLASH storage unit, so as to select the most suitable data reread operation error correction scheme, quickly complete the data error correction, and reduce the user's perception of performance The impact of NAND FLASH can work in a wider range of operating temperatures, thereby increasing the overall operating temperature of SSD.

Description

technical field [0001] The present application relates to the field of semiconductor technology, and in particular to a method and system for increasing the working temperature range of SSD. Background technique [0002] SSD (Solid State Disk) is a hard disk that uses solid-state electronic memory chips as storage media, and consists of a controller unit and a storage unit. NAND FLASH is the most widely used storage medium in the storage unit. Generally, the operating temperature of SSD controller chips can reach -40 degrees to 85 degrees or even higher; while NAND FLASH chips are constantly evolving and updated due to the process, the latest 3D process NAND FLASH operating temperature range is only 0 to 70 degrees . The other passive devices (such as: resistors, capacitors, crystals, etc.) and active devices (power chips, sensor chips) that make up the SSD can basically meet the temperature range of -40 degrees to 85 degrees and above, so the operating temperature of NAND...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/10
CPCG06F11/1048G06F11/1064G06F11/1068
Inventor 易小洪彭鹏姜黎
Owner HUNAN GOKE MICROELECTRONICS
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