Automatic debugging and correcting system and method of light-splitting path for X-ray fluorescence spectrometer

Abstract

The invention relates to an automatic debugging and correcting system and method of the light-splitting path for an X-ray fluorescence spectrometer with sequential wavelength dispersion. The automaticdebugging and correcting system comprises an operation interface module, a crystal-frame control module, a goniometer theta-axis and 2theta-axis high-accuracy stepping motor control module, a detector data acquisition module and a data image processing module. The automatic debugging and correcting system selects the spectral line of a measured element as a reference spectral line of a calibration goniometer, calculating out a crystal glancing angle and a detector emergence angle by a Bragg equation, rotating a theta axis and a 2theta axis of the goniometer to specified positions, realizing automatic adjustment of the positions of crystals and a detector by controlling a stepping motor, the crystal frame and the detector arranged at the theta axis and the 2theta axis and obtaining a crystal correction factor so as to correct the crystal glancing angle and the detector emergence angle. The automatic debugging and correcting system and method have the advantages that remote and automatic debugging for the light splitting path can be realized, debugging persons can be protected from X-ray radiation, the dependency on the debugging experience of the debugging persons can be reduced and the debugging efficiency and accuracy can be improved.

Description

technical field [0001] The invention belongs to the technical field of X-ray fluorescence spectrometers, and relates to a system and method for automatic debugging and correction of light splitting paths of sequential wavelength dispersion X-ray fluorescence spectrometers. Background technique [0002] Sequential wavelength dispersive X-ray fluorescence spectrometer is a precision instrument for precise analysis of element content. It has the characteristics of short analysis time, wide element detection range, many types of analysis samples, and no damage to analysis samples. It is widely used in petrochemical, construction, etc. Materials, metals and inorganic non-metallic materials, ceramics, identification of cultural relics, biological materials, pharmaceutical semiconductors and other fields. The splitting optical path is the core component of the wavelength dispersive fluorescence spectrometer, and plays a vital role in the performance of the instrument. The splittin...

AI Technical Summary

Problems solved by technology

[0008] A sequential wavelength dispersive X-ray fluorescence spectrometer is generally equipped with 5-10 crystals ranging from different elements to meet the measurement of various elements. Every time a crystal is debugged, it is necessary to continuously switch X-rays and remove the protective cover, which is very time-consuming and expensive. Manpower, causing loss to the X-ray source

Since the X-ray intensity collection is discrete, the experience of the debugging personnel is very high when looking for the maximum X-ray intensity, and repeated operations are required to complete the debugging, and the accuracy cannot be guaranteed.

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